Page 66 - Inorganic Mass Spectrometry - Fundamentals and Applications
P. 66

surface of the multiplier  generates  a  pulse  of electrons. This pulse is fed to an
            amplifier  and  then  to  a  discriminator  that  conditions  the  pulse,  filters  out  the
            background,  and  directs  it into a  counterlprocessor  whose  output  consists  of  a
            digital count  rate.
                 One  specific type of pulse-counting  detector is called  a  Daly detector after
                                                 is
            its developer  [98].  In  this  system,  the  ion  beam accelerated  to  20 kV and  directed
            to a  highly  polished  surface  of a  material  with  a  large cross section for secondary
            electron  emission.  Ejected   electrons impinge  on  a  plastic  scintillator,  whose
            flashes of light are  registered by  a  photomultiplier  outside  the  vacuum  system.
            Data  processing  then  proceeds  as  with  the  other pulse-counting  detectors.





                 S has  found widespread  analytical  application in trace  element  analysis,  and
                                                                        In
            its greatest  use  in the routine  analysis of metals,  alloys,  and  semiconductors. the
            last 10 years,  GDMS has become  a routine technique,  providing  reliable data in
            commercial  laboratories.  Semiconductor  materials  compose the majority of sam-
            ple types  analyzed  by  GDMS, but  as  new  methods are developed  to  analyze  such
            things  as  solution  residues  and  nonconductors  (e.g.,  glasses,  ceramics,  and  soils),
            analysis of  other types of  smples may  become  more  common  mong GDMS
            practitioners. This section  highlights  some of  the  novel  applications of GDMS;
            most  of the examples are from the past 10 years. The discussion is not  intended to
            be  all-inclusive  but to provide  an  overview of the direction  in  which the field is
            moving.




            The precise  measurement of isotope  ratios of solids has  always  been  an  important
            area in inorganic  mass  spectrometry.  These  measurements  are  usually  performed
            by  using  thermal  ionization  [see  Chapter l, as  well  as  excellent  reviews  by  Heu-
            mann  (99)  and  DeLaeter  (loo)]. However,  recent interest in  environmental  chem-
            istry  and  the expanding  role  of  mass  spectrometry  in  nuclear  technology  have
                                                          of
            ~enerated a  need for rapid,  relatively  precise  measurement isotope  ratios in bulk
            solids.  Most  of  the  work  in  this  field  has  proceeded   in two  laboratories:  the
            Institute for ~ransuranium Elements  in  Karlsruhe,  Germany [loll, and  the  Oak
            Ridge  National  Laboratory in Oak Ridge,  Tennessee. The inst~~ent used  in  both
            cases  was  the  VG-9000  double-focusing  magnetic  sector  with   reverse Mer-
                            A
            Jo~son  geomet~.  direct current  discharge  was  used  for  all of  the  studies
            reported; the ~arls~he group used  a  secondary  cathode for nonconducting  sam-
            ples  and  the  Oak Ridge group  mixed  their  nonconducting  samples  with  copper  or
            silver powder  prior to analysis.
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