Page 74 - Inorganic Mass Spectrometry - Fundamentals and Applications
P. 74

64


             28.  Cobine,  J.  D.   Gaseous  Conductors:  Theory and ~ngineering Applications; Dover:
                 New  York,  1958;  Chapter  8.
             29.  Hhson, W. V?.; Barshick,  C.  M.;  Klingler,  J.  A.;  Ratliff, P. H.;  Mei, Y. Anal. Chem.
                 1990,62,943A.
             30.  Westwood,  E.  D.   Prog. Sur$  Sci. 1976, 7, 71.
             3  1.  Wehner,  G. K.; Anderson,  G. S. in Handbook of Thin Film  Technology; Maissel,  L.
                 I.; Glang,  R.,  Eds.;  McGraw-Hill Book New  York,  1970;  Chapter  2.
             32.  McHugh,  J. A. in Met~ods  o~Su~ace Analysis; Czanderna,  Ed.;  Elsevier:  New  York,
                 1975.
             33.  Sigmund,  P. Phys. Rev. 1969, 184, 383.
             34.  Winters,  H.  F.  in  Topics  in  Current  chemist^ No. 94, Plasma  chemist^ IIe Veprek,
                 S.; Vervgopalen,  M.,  Eds.;  Springer-Verlag:  Berlin,  1980.
             35.  Fetz,  H.;  Oechsner,  H.  Proc. VI Con$  Int.  Phen.  ionisation duns le  Gaz, Vol. II,
                 1963.
             36.  Wehner,  G.  K. Methods and Phenomena:  Their Applications in Science  and  Technol-
                 ogy,  Vol.  I; Wolsky, S. P.;  Czandera,  A. W.,  Eds.;  Elsevier  Scientific:  New  York,
                  1975.
             37.  Anderson,  H.  H.;  Bay,  H.   L. in Sputtering  by  Particle  Bo~bardment I, Physical
                 Sputtering by  Single-Element Solids; Behrish,  R.,  Ed.;  Springer-Verlag:  Berlin,
                  1981;  Chapter  4.
                                                   of
              38.  Carter,  G.;  Colligon,  J.   S. Ion ~omba~d~ent Solids; American  Elsevier:  New
                  York,  1968.
              39.  Sigmund,  P. in Sputtering by Particle ~ombard~ent I, Physical  Sputtering by Single-
                  Element Solids; Behrish,  R.,  Ed.;  Springer-Verlag:  Berlin,  1981;  Chapter  2.
              40.  Harrison,  D.  E.; Delaplain,  C.  B.  J. Appl. Phys. 1976,  47,  2252.
              41.  Harrison,  D.  E.; Levy,  N. S.; Johnson,  J. P.; Effron, H. M. J. Appl.  Phys. 1968,39,
                  3742.
              42.  Gibson,  J.  B.;  Goland,  A.  N.;  Milgram,  M.;  Vineyard,  G.  H.   Phys. Rev. 1960, 120,
                  1229.
              43.  Nasser,  E.   F~ndum~ntals Gaseous  Ionization  and  Plasma  Electronics;  Wiley-
                                     of
                  Interscience:  New  York,  1971.
              44.  Electron  Impact Ionizat~on; Mark, T. D,; Dum, G.  H.,  Eds.;  Springer-Verlag  Wien:
                  New  York,  1985.
              45.  Valyi,  L.  Atom and Ion Sources; John  Wiley  & Sons: New  York,  1977.
              46,  Field,  F.  H.;  Franklin,  J. L. Electron  Impact  Phenomena;  Academic:  New  York,
                  1970.
              47.  Delcroix,  J.; Ferreira,  C.;  Richard,  A. ih Principles ofkser Plasmas; G.  Bekefi,  Ed.;
                  John  Wiley & Sons:  New  York,  1976;  Chapter  5.
              48.  Bordin,  V.  S.; Kagan, Y.  M. Opt. Spec. 1967, 23, 108.
              49.  Penning,  F, M. Z. Physik 1925, 46, 225.
              50.  Stedman,  D.  H.;  Stetser,   D. W. Prog.  React.  Kinet.  1971, 6, 193.
              5  1.  Eckstein,  E.  W.; Cobm, J, W.; Kay,  E. Int. J. Muss  Spec.  Ion  Phys. 1975,17,  129.
              52.  Strauss,  J. A,;  Ferreira, N. P.;  Human, W. G. C. Spectrochim. Acta 1982,37B,  947.
              53.  Smith,  R, L.;  Serxner,  D.;  Hess,  K. R. Anal. Chem. 1989, 61, 1103.
              54.  Hecq,  M.; Hecq,  A.;  Fontignies,  M. Thin Solid  Films  1984, 1 IS, U5.
   69   70   71   72   73   74   75   76   77   78   79