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16                               DETECTION AND CLASSIFICATION

              The shapes of scrap objects are difficult to predict. Therefore, their
              measurements are scattered all over the space.
                In this example the measurements are more or less clustered accord-
              ing to their true class. Therefore, a new object is likely to have
              measurements that are close to the cluster of the class to which the
              object belongs. Hence, the assignment of a class boils down to decid-
              ing to which cluster the measurements of the object belong. This can
              be done by dividing the 2D measurement space into four different
              partitions; one for each class. A new object is classified according to
              the partitioning to which its measurement vector points.
                Unfortunately, some clusters are in each other’s vicinity, or even
              overlapping. In these regions the choice of the partitioning is critical.

            This chapter addresses the problem of how to design a pattern classifier.
            This is done within a Bayesian-theoretic framework. Section 2.1
            discusses the general case. In Sections 2.1.1 and 2.1.2 two particular
            cases are dealt with. The so-called ‘reject option’ is introduced in Section
            2.2. Finally, the two-class case, often called ‘detection’, is covered by
            Section 2.3.



            2.1   BAYESIAN CLASSIFICATION

            Probability theory is a solid base for pattern classification design. In this
            approach the pattern-generating mechanism is represented within a
            probabilistic framework. Figure 2.3 shows such a framework. The start-
            ing point is a stochastic experiment (Appendix C.1) defined by a set
            O ¼f! 1 , .. . ,! K g of K classes. We assume that the classes are mutually
            exclusive. The probability P(! k ) of having a class ! k is called the prior



             measurement data not available (prior)  measurement data available (posterior)

                                             measurement           assigned
                         class         sensory  vector              class
               experiment     object                       pattern
                         ω ∈Ω          system    z      classification  y(z)



               Ω = {ω 1 ,...,ω k }
                 P (ω )
                    k
            Figure 2.3  Statistical pattern classification
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