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Soil Minerals
                                                                                           Soil Minerals  125

                                                                                          Figure 6.3
                                                                                          Derivation of the
                                                                                          Bragg Law
                                                                                          relating diffraction
                                                                                          angle to d-spacing.









                  Bragg, father and son, suggested that even though X-rays actually come from
                  point sources, namely electrons in crystalline atoms, the rays may be thought of as
                  reflecting from atomic planes. As a wave front is reflected from adjacent planes,
                  the interlayer distance imposes an extra path length that is shown in Fig. 6.3.
                  In order for rays to reinforce, that extra path length must equal an exact number
                  of wavelengths. This enables writing an equation:
                    nl ¼ 2d sin                                                    ð6:1Þ

                  where n is a whole number, l is the X-ray wavelength, d is the distance between
                  identical crystal planes, and   is the diffraction angle. This is the Bragg Law.
                  When a reflection occurs, the interlayer distance d is obtained by measuring the
                  angle and knowing the X-ray wavelength.

                  If a reflection is obtained with n ¼ 1, according to eq. (6.1) another reflection
                  should be obtained with n ¼ 2, or at exactly one-half of the d-spacing. This is
                  called a second-order reflection. In general as the order increases the reflection
                  becomes weaker, but that is not always the case. Reflection intensities are modeled
                  with Fourier analyses for determination of crystal structures.

                                            ˚
                                                        ˚
                  The unit of measure is the Angstom, or A, which equals 10  8 cm or 10 nm
                  (nanometers). As a reference, the diameter of an oxygen ion in crystal structures is
                      ˚
                  2.64 A.
                  Example 6.1
                  Mica, the shiny, flakey mineral in mica schist, is closely related to clay minerals and gives
                                                                          ˚
                  an X-ray diffraction angle 2  ¼ 8.88 with an X-ray wavelength of 1.54 A. At what angle
                  may one expect a second-order reflection?

                  Answer: Equation (6.1) solved for the first-order reflection is

                    ð1Þð1:54Þ¼ 2ðdÞ sin ð4:4 Þ
                                  ˚
                  from which d ¼ 10.0 A. Substituting this value in eq. (6.1) and solving for n ¼ 2 gives
                    ð2Þð1:54Þ¼ 2ð10:0Þ sin
                              2  ¼ 17:7

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