Page 296 - Inorganic Mass Spectrometry - Fundamentals and Applications
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                   rf-GDMS Analysis of NIST 610  Trace  Elements  in  Glass Standard
                                       intern^ (n = 3)  External   (n = 5)
                  Cert.  Avg.  Avg.
                  value  RSF  conc.       %RSD  %Err.  conc,   %RSD  %En.

            0    50.37%   2.43     50.39   1  .5  1.9   52.10   11.3    1.4
            Na    5.19    0.658     5.19   0.4  0.1      4.78   13.6    7.9
            A1    0.53    0.273     0.55   2.0  3.4      0.52   10.4    2.4
            Si   33-66    1  .oo   33.99   0.4     l .o   32.99   4.9   2.0
            Ca    8.58    0.00443   9.07   1 .o   5.7    8.95    2.9    4.3
            Ti   437  ppm   0.00625  453   0. 1   3.7   43  1    4.7    1  .3
            Mn  485       1.29    492      0.3  1.5    497       2.7    2.5
            Fe   458      0.00262  555     6.6  21.3    546     14.2   19.2
            CO   390      1.25    394      0.6  1.1     398      3.2    2.0
            Ni   459      0.097  1  469    0.7  2.3    466       6.4    1.5
            Zn   433      0.168   41  8    1  .2  3.4   408      5.8    5.9
            Rb   426      1  .28   440     0.9  3.4    435       2.5    2.2
            Sr   5  16    2.08    53  1    0.7  3.0     517      4.9    0.3
            f%2   254     2.54    262      1.8  3.2     243      5.7    4.5
            Ce   450      6.68    457      0.7  1.5     437      6.3    3.0
            Eu   450      4.21    433      1.3  3.8     434      3.1    3.5
            Au   25       1.72     24      0.3  2.2     23      10.6    8.0
            TI   61.8     9.34     65      1.7  5.8     59      10.9    4.5
            Pb   426      6.92    429      1.2  0.7     415      6.8    2.7
            Th   457.2   5  1.42   447     2.3  2.3     423      8.9    7.6
            U   46  1  .5  66.59   447     1.4  3.1     427      8.3    7.4
            Discharge conditions: rf power = 35W, Ar  Aow rate = 2.00  sccm;  orifice dimter = €0 mm;  cell
            = €0 mm.
            Source: Ref. 29.



            data  reflecting  the  external  reproducibility  represent  five  complete  analysis  cycles
                                                                          for
            with the sample  exposed  to  atmosphere,  reintroduced,  and  sputter-equilibrated
                                                              to
            60 min.  In  this case, the  previously  determined  RSFs  are  shown compensate ef-
            fectively for differences  in sample surface  and  plasma  discharge  conditions. The
            repeatability  values  presented here are  very  good  and  do not  differ si~nificantly
            from  those  achieved  in  conventional dc GD-MS  analysis of alloys  using  this in-
                                        of
            strument. By the  same  token,  limits detection  obtained for trace elements  in  glass
            matrix  materials  are  not  appreciably  different  than  those for alloys. As an  exam-
            ple of this  characteristic,  Fig.  7.8 depicts the  mass  spectrum  obtained for the  lead
            isotopes  present  in  an  NIST  612 Trace  Elements  in  Glass  sample  generated by a
                                           a
            flat-type rf GD-MS source  mounted  on  V69000 (Winsford,  Cheshire, UK) mag-
            netic  sector  mass  spectrometer.  On the basis of the  observed  signal-to-noise  char-
            acteristics, the detection limit for the  204Pb isotope (504 ppb  in  sample) is calcu-
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