Page 339 - MEMS and Microstructures in Aerospace Applications
P. 339

Osiander / MEMS and microstructures in Aerospace applications  DK3181_c015 Final Proof page 332 1.9.2005 12:52pm




                   332                       MEMS and Microstructures in Aerospace Applications


                       Contamination from outgassing may bind to other materials present in the
                   environment, leading to clogging or build up of material. Depending on the
                   configuration, the device may become inoperable. Contamination binding with
                   other materials or allowing a build up have been found to cause device failure
                                           21
                   when in crucial active areas.
                   15.4.2 STICTION
                   With their small dimensions, MEMS structures are dominated by surface forces,
                   especially the van der Waals force, that cause microscopic structures to stick
                   together. Van der Waals forces bonding two clean surfaces together are a result
                   of instantaneous dipole moments of atoms. If two flat parallel surfaces become
                   separated by less than a characteristic distance of z 0 , which is approximately 20 nm,
                   the attractive pressure will be given by:
                                                        A
                                                P vdW ¼                          (15:1)
                                                      6pd 2

                   where
                       A is Hamaker constant (1.6 eV for Si) and
                       d the separation between the surfaces.

                       While this equation ignores the repulsive part of the surface forces and over-
                   estimates the force of adhesion by at least a factor of two, it allows for an order of
                   approximations for adhesive forces. Typical values of d are in the order of several
                   angstroms. 2,22  As soon as a flexible structure comes close enough to another surface
                   so that this force is stronger than the elastic force retracting the structure, the two
                   surfaces will almost permanently stick together.
                       The probability of stiction occuring may be reduced with designs where surfaces
                   that can contact other surfaces are minimized, for example, by using small dimples
                   which hold the structures at a distance. Forces that can cause stiction in MEMS
                   devices are capillary force and electrostatic force. Causes of stiction also include
                   shock-induced stiction (mechanical overstress) and voltage overstress, which can
                   both result in large areas in contact and allow stiction to occur. 21
                       Processing techniques, such as critical drying after the release, may reduce the
                   potential for stiction to occur as a result of the capillary forces. The ability to
                   successfully release a MEMS device is a critical processing step of a MEMS device.
                   Due to the inherent proximity of the moving structure and the surrounding surfaces,
                   the final drying process on a surface micromachined polysilicon structure can lead
                   to permanent stiction of the structure dependent upon the various drying techniques
                            23
                   employed.  Stiction induced by capillary forces during the postrelease drying step
                   of MEMS fabrication can substantially limit the functional yield of complex
                   devices. Supercritical CO 2 drying provides a method to remove liquid from the
                   device surface without creating a liquid or vapor interface, thereby mitigating
                   stiction. 24  Fluoro- or hydrocarbon coatings can be used on MEMS surfaces after
                   they are released to lower the surface interaction energy and prevent stiction during




                   © 2006 by Taylor & Francis Group, LLC
   334   335   336   337   338   339   340   341   342   343   344