Page 170 - Principles of Catalyst Development
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1S8                                                      CHAPTER  7
            significant contributions  to  our understanding  of practical  catalysts, such
            as  ammonia  synthesis.  Instrumentation  has  developed  to  a  point  where
            these methods are used on powders and have become available as routine
            tools  to  most  organizations.  They  now  assume  a  position  in  the  array of
            characterization techniques discussed in this chapter.
                We  will  consider  only  those  methods  from  surface  chemistry  and
            physics that are currently applicable to practical powder catalysts and that
            are  now,  or soon  will  be,  readily  available  to  most  workers.  These  cover
            the characterization of (1)  morphology and composition, (2) structure, (3)
            dispersion,  (4) acidity,  and  (5) activity. The first  is  included since the size
            and  shape  of  component  crystallites  is  intimately  connected  to  surface
            properties. The last factor,  activity, must be considered a vital  characteriz-
            ation tool  during catalyst development.

            7.4.1.  Morphology
                Shape and size are two important features of morphology. Of secondary
            interest is crystallite size distribution. Information of this nature is necessary
            for  complete  knowledge  of all  catalytic  components.  It is  especially  sig-
            nificant  for  highly  dispersed  systems.  Instrumentation  for this  purpose
            includes  various types  of electron microscopy and x-ray devices.

            7.4.1.1.  Scanning Electron  Microscopy  (SEM)
                Scanning electron microscopy (SEM) scans over a sample surface with
            a  probe of electrons  (5-50 kY).  Electrons  (and photons), backscattered or
            emitted,  produce an image on a  cathode-ray tube, scanned synchronously
            with  the  beam.  Magnification  of 20-50,000  are  possible  with  a  resolution
            of about  5 nm.  There  is  a  very  high  depth  of field  and  highly  irregular
            structures are  revealed  with a  three-dimensional effect.
                The SEM is a powerful tool for study of overall topography. (221) Sample
            preparation is not demanding, so that practical catalysts are easily handled.
            Resolution limitations, however, restrict the technique to crystallites larger
           than 5 nm in size. Above this level, crystallite shape, size, and size distribu-
            tions  are  easily  obtained.  SEM  investigations  have  been  made  on  many
           systems  and  are  useful,  not only  in  crystallite  characterization but also  in
            pore structure studies. (20))

            7.4.1.2.  Transmission  Electron  Microscopy  (TEM)
                In transmission electron microscopy (TEM), 100 kY or higher electrons
           are  transmitted  through  a  thin  spectrum  and the  scattered electrons  mag-
           nified  with  electromagnetic  optics.  Images  are  projected  onto  fluorescent
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