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                                    O n e
                           Cha p te r

                          FIGURE 1.25
                                  ®
                          Spectralon
                          calibration
                          material.









                          inert, and washable standards have typical reflectance values of 95 to
                          99 percent and are spectrally flat over the UV-VIS-NIR spectrum. Spec-
                          tralon SRM-99 reflectance material is the most Lambertian reflector
                          available for use over the wavelength range from 250–2500 nm. All
                          reflectance calibration tests are directly traceable to NIST (Fig. 1.25).
                             It is used for calibrating:

                              •  Densitometers
                              •  Integrating sphere systems
                              •  Optical equipment
                              •  Photographic equipment
                              •  Reflectometers
                              •  Remote sensing
                              •  Spectroscopy instruments


                          1.16.2 Spectralon® Features

                              •  Highest diffuse reflectance values of any known substance
                              •  Durable, chemically inert, and washable standards
                              •  Reflectance values of 95–99 percent
                              •  Spectrally flat over the UV-VIS-NIR spectrum
                              •  Data from 250–2500 nm, in 50-nm increments
                              •  NIST traceable calibration



                     Further Reading
                          Chappel, A. (ed.), Optoelectronics: Theory and Practice, McGraw-Hill, New York,
                             1978.
                          Doebelin, E. O., Measurement Systems: Application and Design, 4th ed., McGraw-Hill,
                             New York, 1990.
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