Page 172 - Troubleshooting Analog Circuits
P. 172

Letters to Bob                                                   I59


                           LMC662 have the lowest leakages in plastic DIPS, which are made by an automated
                            process and are untouched by human hands. The TO-99 and CERDIP packages are
                           not nearly as good as the plastic minidips which do   R repeatably.
                        17.  “Protection diodes can rectify high-frequency noise.” I have never seen this one.
                           Boy, Roy, you must live in a nasty neighborhood for ambient RF noises. You can
                           probably run a transistor radio without any batteries.

                        18.  I forgot to even mention thermal probes. We use such probes more for characterizing
                            than for troubleshooting. Often, a soldering iron does the troubleshooting job faster
                            but more crudely.
                        19.  The LF198 data sheet mentions that you should not let the Sample input move too
                            slowly. Are there other S/H circuits that are touchy? Ones that do not mention this
                            fact in their data sheets?
                        22.  I rarely work with wrapped-wire stuff, but I bet a lot of people get fooled by bad
                            daisy-chaining of power-supply runs and lousy power-supply bypassing-whether
                            for linear or digital ICs.
                        23.  I rarely find batteries necessary, but. in extreme cases, they are useful.
                        24.  I rarely find notching out 60- or 120-Hz interference necessary. I usually subtract the
                            60-Hz noises visually from a scope trace.
                        25.  Yes, portable preamps are often useful.
                        26.  Just as I was saying back in Chapter 8-it’s  silly to assume that the CM error is
                            linear.
                        27.  Design reviews are a good idea. But even if the circuit design is perfect, I find the lay-
                            out to be pretty critical. So a beer check by all your buddies is awfully important, too.


                                                                         RAP




                              Dear Bob:

                              As a practicing technician for many years, I want to comment on one or two things
                            I read in your series and perhaps pass on an experience or two.
                              On page 130 of the August 17, 1989 article (new Chapter 7) you mention the pos-
                            sibly harmful side effects of drawing base current out of a transistor. Most (if not all)
                            of the switched-mode power supplies I have come across appear to do just that-to
                            switch the transistor off more quickly by removing carriers from the base.
                              This technique appears to work well in practice. I have used the technique in many
                            of the inverters I have designed, and (on the face of it, at least) there doesn’t appear to
                            be any component deterioration over time. I usually use some form of reverse-
                            voltage limiting to ensure that the base-emitter junction doesn’t undergo zener break-
                            down.
                              Referring to your comments on p.  132 of the same article, I have to disagree on the
                            advisability of plugging MOS ICs into sockets with the power applied. I consider it
                            inadvisable because power may easily be sourced to the chip via its input and output
                            pins in this situation. Some manufacturers forbid this by implication in the “Electrical
                            Characteristics” section of their data sheets, and I have witnessed device destruction
                            being caused by this practice. I am also unable to agree with your comments on not
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