Page 55 - Wire Bonding in Microelectronics
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34     Cha pte r  T w o


              This activation energy is supplied by the high-interface temperature,
              which for most TC bonding is around 300°C. The temperature is usu-
              ally supplied by heating the entire device, that is, placing it in contact
              with the heated work holder (WH). However, variations that heat the
              bonding tool alone (≥400°C) or in combination with WH heating, have
              also been used. Ball-bonding technologies normally feed the wire
              through a capillary, and the tool can move in any direction after making
              the ball bond. This results in current autoball-bonding machines
              being several times faster than ones designed for wedge bonding.
                 A majority of the TC bonding-mechanism studies were done at
              Bell Laboratories and Western Electric. [2-32, 2-54 to 2-56]. However,
              important work was also done by others [2-57, 2-58]. Thermocom-
              pression bonding is more sensitive to surface contaminants than any
              other bonding method (see Sec. 7.2), the bonding time is much longer,
              and the interface temperature is higher. Because of these, this process
              is seldom used in microelec tronics today, having been replaced by
              thermosonic bonding.

              2.6.2  Ultrasonic Wedge Bonding (Small- and
                     Large-Diameter Wires)
              Ultrasonic wedge bonding was introduced to the microelectronics
              industry in about 1960 and became dominant in device production,
              until gold-ball thermosonic autobonders took over. Ultrasonic wedge
              bonding is normally done at room temperature (if heated, it is also
              called thermosonic bonding). It is primarily used to bond Al wire to
              either Au or Al bond pads, although it can bond Au wire with special
              “gold bonding” tools (cross-grooved or roughened). Large-wire Al US
              bonding is the dominant method of interconnecting power devices.
              The US weld is formed by the application of ultrasonic energy through
              a resonating transducer-tool combination while applying a clamping
              force. An example of the transducer and bonding tool configuration
              and vibration modes were given in Figs. 2-1 and 2-2 and the bonding
              sequence in Chap. 1, Fig. 1-2. The wedge-bonding system (transducer-
              tool combination) must be oriented in approximately a straight line
              from the first bond to the second, before the first bond is made. This
              is a disadvantage for autobonders, since it requires mechanically align-
              ing the package or the transducer for each wire. This slows down the
              wire bonding process by more than 50%, requiring several times more
              autobonders (and their overhead costs) to bond the same number of
              devices as thermosonic ball bonders.
                 Large-diameter Al wire bonding is used primarily in power devices
              and hybrids that require more than several amperes per wire. Such
              wire bonding is addressed in various parts of this book in appropriate
              context, rather than in a separate section. Large-Al wires are bonded by
              cold ultrasonic welding methods, using 60 or 80 kHz US power sup-
              plies, although in earlier times some used 25 kHz. Large wire is usually
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