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230    Cha pte r  Ni ne

              When AMI had a rod 1.5 to 2 mm in diameter and 8 cm long tested at
              Quantronix, 50 percent of the energy was lost by scatter due to the
              lack of a smooth surface. As evidence of that fact, transmission varied
              greatly with angle of incidence of the beam relative to the face of the
              rod. Rods were etched to reduce diameter and smooth their outside
              surfaces. The quality of the etched surface was affected by seed
              orientation. Even so, rods in this diameter range had, on average, a
              bend-to-break radius of about 1.75 in. There was wide variation
              depending on the seed orientation. The silicon fibers were not flexible.
              Absorption and resistance to the intense radiation test were passed.
              Figure 9.13 shows typical results for single-crystal grown silicon rods.



        9.7  Gallium Arsenide as an Infrared Optical Material
              The effort to develop the compound semiconductor gallium arsenide
              (GaAs) began in the late 1950s at TI. As mentioned earlier, George
              Cronin was deeply involved in the effort from the beginning. The
              idea was to replace silicon for high-frequency devices and enjoy
              greater temperature stability due to a larger bandgap than that in
              silicon. Production of GaAs in purity and quality as a device material
              that could be fabricated went on for years. The technological difficul-
              ties associated with crystal, growth, preparation, and device fabrica-
              tion had been greatly underestimated. The author was only slightly
              involved as part of his assignment in the analytical chemistry group
              as head of physical methods applied to semiconductor materials, e.g.,
              measuring the photoconductivity associated with impurities as a
              function of wavelength in GaAs crystals. The author measured and
              characterized, using the Perkin Elmer 13 instrument, the light output
              from the first TI gallium arsenide light emitters. From the measure-
              ments, conversion efficiency of current to light was calculated for the
              first time. Several TI GaAs transistor task force teams were organized
              and operated over several years, trying to solve all the production
              problems.
                 The author first became interested in GaAs as an infrared optical
              material during the high-energy laser window programs 12,13  of the
              1970s when GaAs became considered as an optical material rather
              than used only for electronic devices. On the periodic chart, Ga is on
              one side of Ge and As is on the other side. GaAs is said to be isoelec-
              tronic with Ge. Many of the physical properties of the two materials
              are almost identical. As one of the candidate window materials, GaAs
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              suffered  from not being produced in large enough size, high enough
              purity, low enough cost and was shown to be subject to high-speed
              rain erosion damage. Over silicon and germanium it had an upper
              use temperature of 400°C. At TI in the 1960s, George Cronin and his
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              colleague Bob Haisty  developed a method based on chromium
              doping to insure gallium arsenide would be semi-insulating. Cronin
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