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128 Diode Lasers Semiconductor Laser Diodes 129

sizes are needed to prove such low failure rates. The high expense of
module life testing (e.g., capital equipment) necessitates judicious
leveraging of common platform design and process reliability data.
Unlike sudden, or “hard,” chip failures, coupling stability is “soft,”
with a failure rate that gradually increases over time (β > 1); hence,
field-failure statistics normally lead to an optimistic portrayal of the
true coupling failure rate as specified (e.g., by end-of-life ≥ 10%
change in current or power), because field failures may go unnoticed
or may not be reported in the early phase of deployment.

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