Page 306 - Inorganic Mass Spectrometry - Fundamentals and Applications
P. 306

Multiple-Colle~tor lCP-MS                                     293


         Naturally,  one  wants to achieve  high  transmission  and  extract  as  many  ions from
                                                40h+ ion  beam  can be as  large as
         this  source  as is possible,  and  in  fact  the  focused
         a  microampere.  However,  high-precision isotopic measurements require ultrahigh
         vacuum (<lo"* mbar)  in  order to minimize collisions between  analyte ions and
         atoms  in the residual  vacuum  envelope  and  preserve  good  peak  shapes.  Therefore,
         all MC-ICP-MS  instruments  need to be  accompanied  by  a  considerable  inventory
                                                       the
                                                     at
         of pumps  to  achieve  efficient  near-supersonic  extraction cone interface,  pump
         away  residual  h, and  maintain  ultrahigh  vacuum  in the analyzer.
              Second, the source of  ions is geometrically  broad  compared  with  that  in
         TMS. Therefore,  the  extracted  ions  need to be  spatially  restricted  and  direction-
         ally  focused  at the source (defi~ng) slit with  minimal loss of transmission,  in  order
         for the  mass  resolved  ion  beams to fit  easily  within  the  openings of the  multiple
         Faraday  detectors  (buckets)  and  produce  excellent  peak  shape.
              Third, the ions in such an inductively  coupled  h plasma  source  possess  a
         broad  energy  spread of up to -15  V,  sometimes as high  as 20-30  V-roughly  two
         orders of magnitude  greater  than  in  TIMS.  Therefore,  the ions of interest need to
         be  focused  and  restricted  in  their  energy  spread  before  entering  the  magnetic  sec-
         tor; otherwise  they  will  not  be  focused the  collectors  and the peak shape will be
                                        at
         greatly  degraded.  In  practice,  the  energy  spread of all components,  including the
         plasma  support  gas, is too  great  to  provide the same  focusing for all ions. This does
         not  matter,  however,  so long  as  the  ions of interest are  focused.
              Fourth, all plasma  sources are inherently  unstable  relative to the best TNS
         sources.  Improving  plasma  stability  assists the task of energy  and  directional fo-
         cusing.  However, the single-detector  system is too slow to respond to the changes
         in  signal size resulting  from  plasma  instability  if  sequential data collection is de-
                                    it
         ployed. To achieve  high  precision is essential to use  simultaneous  multiple  Fara-
         day  collection to cancel  out  the  effects of plasma  instability.  Therefore, all instru-
         ments  need  broad  dispersion  to  incorporate  multiple  collectors  and produce  ion
                                                               to
                                z direction  with  minimal  aberrations.  Hence  extended
         beams  that  are  focused  in  the
         geometry is the  norm for MC-ICP-MS.
                                                     to
              The only  such  multiple-collector  ICP-MS  proved operate in a  routine  man-
         ner  with  a  significant  track  record at the  time of writing is manufactured  by VG
         Elemental  under the model  name  Plasma 54 (hereafter  P54).  However, three new
         and  interesting ins~ments are  being  developed  and  marketed,  one  by Nu Instru-
         ments,  the  second by Micromass  Inc.,  and the third by  VG Elemental.  Each of these
         latter instruments  utilizes ICP sources  with  a large potential  difference  (rt4 to 6
                                         all
         kV)  relative to the  analyzer  region.  They differ from the P54 by  including  a  lam-
         inated  magnet capable of fast scanning  and  are  accompanied  by  a  range inno-
                                                                    of
         vative  solutions to the design  obstacles  discussed.  The  footprints  are  smaller. The
                                                              of
         electronics are greatly  simplified  and  modernized  relative  to  those the  P54,  with
                                       of
         computerized  monitoring  and  control nearly all instrument  parameters. The data
                                                                       Vi-
         control software suites are  relatively  accessible.  Many  programs  are  written  in
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