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Olesik

            transform  ion  cyclotron  resonance  mass  spectrometers  has   also been  reported.
            Although  most  samples  are  introduced   into the instrument  as  solutions,  laser
            ablation  and  other  solid  sampling  approaches  are  also available comercially.
                Although  ICP-MS is a  highly  successful  and  powerful  technique,  several
            problems  remain.  When  attempting to measure  low  concentrations  (sub-part  per
            billion)  spectral  overlaps  due  to  polyatomic ions can  be  difficult  to  identify  and
            overcome,  particularly  with  quadrupole   or  time-of-~ight mass  spectrometers.
            Iron,  calcium,  and  potassium  typically  suffer from rather severe spectral overlaps
            unless  special  steps  are taken.  Arsenic,  selenium,   c~o~urn, vanadium,  and
            titanium  often  suffer  from  polyatomic  ion spectral overlaps  that  degrade  detection
            limits. Molecular  ion  spectral overlaps  are  most  common  below  mass   82 [33.
            Matrix effects due to high  concentrations  of  concomitant  species,  particularly
            heavy  elements, can  be  severe when  conditions  are  optimized   for  ~~imum
            analyte  sensitivity.  Because  the  sample must  be  physically  transported  into the
            mass  spectrometer,  deposition  and  contamination of the ins~ment can be prob-
            lems (unlike ICP optical  emission  spectroscopy,  in  which  photons  are  clean). For
            some  applications  short- and long-term  precision is inadequate. In some applica-
            tions,  even  better  detection  limits or sensitivities  are  required. The initial equip-
            ment  and  operating  costs are  high.






                                         3.1) consists of a sample introduction  system
            The typical  ICP-MS  instrument  (Fig.
            (a nebulizer  and  spray  chamber),  an  inductively  coupled  plasma  source,  a  differ-























                  1  Components of  a typical ICP-MS instrument.
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