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P. 547

Detectors 529
             the  faces.  If  the  resistivity  of  this  material  is   thermal  processes. By  reducing the temperature
             2000 61 cm, with ohmic contacts on each side, then   of the detector by liquid nitrogen to about  IT E;
             the  skice  would  behave  like a  resistor  of  2000,   most of this background is removed, but in prac-
             and if  100%’ is applied across such a resistor then   tical detectors the effect of surface contaminants
             Ol1m’:s Law states that a current  of 0.5 A would   on those surfaces not  forming the diode can  be
             pass. If radiation now falls on the silicon slice, a   acute.  Various  methods  of  avoiding  these pro-
             minute extra  current  will  be  produced,  but  this   blems,  such  as  the  use  of  guard  rings,  have
             would! be  so small compared  with  the  standing   reduced  much  of  this  problem.  However,  the
             0.5 A curreiit that it would be undetectable. This   effects of very small amounts of oxygen, etc,; can
             is  different  from  the  gas-ionization  chamber,   have devastating results on a detector, 2nd most
             \&ere  the  standing  current  is  extremely  small.   are enclosed in a h~gh-~7acuu~ chaniber.
             The so~~~tio1~ to this problem is provided by semi-   By doping a ~erman~u~ or silicon crystal with
                                                            (an
             conductor junctions. The operation  of junctions   l~tl~~um ~nterstiti~ donorj,  which  is  carried
             depends on the fact that a mass action law com-   out  at moderate  t~rnpe~~~ures using  an electric
             pels the product  of electron and hole concentra-   field  across  the  crystal,  the  acceptors  can  be
                                                                      compensate^ in p-type silicon
             tions to be constant for a given semiconductor at   almost eoii~plete13~
             a  fixed  ~empe~ature. Therefore.  heavy  doping   and germanium, This allows the preparation  of
             with  a  donor  such  as  phospho~~Is not  only   relatively large detectors suitable for high-energy
             increases the free electron concentration  but also   charged  particle  spectroscopy.  By  this  nieaiis
             depresses the  hole  Concentration  to  satisfy  the   coaxial  detectors  with  volumes  up  to  about
             relation  that  the  product  IT~LIS~ have  a  valse   100 cm3 have been made, and these have revolu-
             dependent only on the semiconductor. For exam-   tionized  gamma-ray  spectroscopy,  as  they  can
             ple, silicon at room temperature has the relation   separate energy lines in a spectrum which earlier
             n x IJ z 10”.  where YL is the number of holes and   NaI  (Tl)  scintillation  spectrometers  could  not
             p  is t:he number  of  electrons. Hence in  a  region   resolve.
             where the number of  donors is doped to a con-   New work on purifying germanium and silicon
             centration  of  1Q18 the  number  of  holes will  be   has  resulted in  the  manufacture of  detectors  of
             reduced to about 10‘.  McKay, of Bell Telephone   super-pure  quality  such  that  lithium  drifting  is
             Laboratories, first demonstrated in 1949 that ifa   not required. Detectors made from such material
             reverse-biased pa junction is formed on the semi-   can be  cycled  from room  temperature to liquid-
             conductor a strong electric field may be provided   nitrogen  temperature  and  back  when  required
             across the  device which sweeps away  free  holes   without the permanent damage that would  QCCW
             from  the  junction  on  the  y-side  (doped  with   with  lithium-drifted  detectors.  SurFace-contam-
             boron)  (Figure 22.5) and electrons away from it   ination problems, however, still require  them to
             on ?he n-side (doped with phosphorus). A region   be kept in  IJLICUO. Such materia! is the purest ever
             is  produced  which is  free of holes  or electrons,   produced-about  1 part in 10’’  of contaminants.
             and is kno-cvi:  as the depletion region. However. if
             an ionizing particle or quantum of gamma energy
             passes  through  the  region.  pairs  of  holes  and   22.2.4  Detector applications
             electrons  are  produced  which  are  collected  to   Iii  a11  radiation-measuring  systems  there  are
             produce a current  in the external circuit. This is   several common factors which apply to measure-
             the basic operation of a semiconductor detector.   ments to be carried out. These are:
             The ttackground signal is due to the collection of
             any  pairs  of  holes  plus  electrons  produced  by   (1)  Geometry;
                                                      (2)  Scattering:
                                                      (3) Bac~scait~rin~:
                                     toad
                                     resistance       (4) Absorp~ion;
                                                      (5) Self-absorp~ion.
                                                                    ~
                                                                           ~
                                                                                  ~
                 Electron motion                      ~      e  Since any radioacxive source emits  ~its   ~  ~  ~   !
                                                      products  in all  directions  (in  4?i geometry) it  Is
                                  Depletion
                                  region              important  10 be able to calculate how many par-
                    Hole motion                       ticles  or quanta may  be  collected  by  the  active
                                                      volume  of  the  counter.  If  we  consider  a  point
                                                      source  of  radiation  as  in  Figure  22.6,  then  all
                                                      the emitted  radiation  from  the  source will  pass
                                                      through  an imaginary sphere with  the  source at
             Figure 22.5  Schematic diagram ofsemiconductor   center, providing there is no absorption. Also, for
             derector                                 any given  sphere size.  the average radiation  flux
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