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2.7. Processing with Photorefractive Optics 1 29
determined by setting W = X and S = 0, for which we have
2h =
Xd '
When the readout beam is shifted closer to the input object by a distance S,
the distance between the zeroth-order and the first-order diffraction will be
2h — S. To avoid overlapping between the two diffraction orders, the separ-
ation between them should be greater than twice the target X; that is,
2h-S^2X, (2.121)
for which the maximum permissible target translation is
s =
max
Xd
The shift-tolerance FOM for the JTC can be written as
2n
FOM, TC = XS mM = 4^ ~ 2X\ (2.123)
which is inversely proportional to the thickness of the PR crystal and decreases
rapidly as the width of the target X increases.
Similarly, for the RC correlation shown in Fig. 2.43, the Bragg diffraction
wave vectors can be written as
i ,
'
- a
k ~ X3 n \
where k 0 and k x are the writing vectors, and k 2 and k 3 are the reading and the
diffracted wave vectors, respectively. With reference to momentum conserva-