Page 43 - Introduction to Mineral Exploration
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26   A.M. EVANS



                  method may have to be used. Some primary tin  such as Berry et al. (1983) or the more compre-
                  deposits contain appreciable amounts of topaz  hensive method in Jones (1987).
                  which, because of its hardness, increases the  The techniques of identifying minerals in
                  abrasion of crushing and grinding equipment,  thin section are taught to all geologists and
                  thus raising the operating costs.           in polished sections to most, and will not be
                    To summarize, the information that is     described here. For polished section work the
                  required from a sample includes some, or all, of  reader is referred to Craig and Vaughan (1994)
                  the following: (i) the grade of the economic  and Ineson (1989), as well as the online manual
                  minerals; (ii) the bulk chemical composition;  of Ixer and Duller (1998). Modern optical micro-
                  (iii) the minerals present; (iv) the proportions  scopes have significantly increased resolution
                  of each of these and their chemical composi-  and oil immersion is not often used in com-
                  tions; (v) their grain size; (vi) their textures and  mercial laboratories. Simple microscope and
                  mineral locking patterns; (vii) any changes in  scanning electron microscope (SEM) methods
                  these features from one part of an orebody to  are usually all that is required to effectively
                  another.                                    identify all the minerals in the samples. SEM
                                                              and other methods requiring sophisticated
                                                              equipment are discussed below.
                  2.2.1 Sampling
                  Mineralogical investigations will lose much of
                  their value if they are not based on systematic  X-ray diffraction
                  and adequate sampling of all the material that  X-ray diffraction is used to identify clay min-
                  might go through the processing plant, i.e. min-  eral structure and properties, and for mineral
                  eralized material and host rock. The basics of  analysis and mineral abundance measurements
                  sound sampling procedures are discussed in  through spectroscopic sensing. Modern X-ray
                  Chapter 10. The material on which the miner-  diffractometers can work well on solid speci-
                  alogist will have to work can vary from solid,  mens, compacted powder pellets representing
                  coherent rock through rock fragments and    whole rocks, or on a few grains on a smear
                  chips with accompanying fines to loose sand.  mount. Multiple mounts can be automatically
                  Where there is considerable variation in the  fed into the diffractometer.
                  size of particles in the sample it is advant-  The rock sample is normally powdered and
                  ageous to screen (sieve) the sample to obtain  packed into an aluminum holder. It is then
                  particles of roughly the same size, as these  placed in the diffractometer and bombarded
                  screened fractions are much easier to sample  with X-rays. The diffracted rays are collected
                  than the unsized material.                  by a detector and the information relayed to a
                    The mineralogist will normally subsample  computer where it is converted to d-values
                  the primary samples obtained by geologists  of specific intensities. This information can
                  from the prospect to produce a secondary    then be shown graphically in the form of
                  sample, and this in turn may be further reduced  a diffraction pattern or “diffractogram.” The
                  in bulk to provide the working sample using  diffractograms from the unknown sample are
                  techniques discussed in Jones (1987) and recent  then matched against a database of 70,000
                  technological innovations.                  recorded phases for mineral identification. The
                                                              latest instruments allow for rapid recognition
                                                              of the entire spectrum of the sample in minutes
                  2.2.2 Mineral identification
                                                              using a computer to match patterns and iden-
                  Initial investigations should be made using  tify the minerals present.
                  the naked eye, the hand lens and a stereobino-
                  cular microscope to: (i) determine the ore types
                  present and (ii) select representative specimens  Electron and ion probe microanalyzers
                  for thin and polished section preparation. At  With this equipment a beam of high energy
                                                                                                 2
                  this stage uncommon minerals may be iden-   electrons is focused on to about 1–2 µm  of the
                  tified in the hand specimen by using the deter-  surface of a polished section or a polished thin
                  minative charts in mineralogical textbooks  section. Some of the electrons are reflected and
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