Page 193 - Macromolecular Crystallography
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182  MACROMOLECULAR CRYS TALLOGRAPHY

        Edge Spectroscopy (XANES) can be used to esti-  which uses an undulator as its X-ray source, stan-
        mate the expected absorption energy of the anoma-  dard exposure times are used for most samples. At
        lous atoms. For example, SGX has determined the  the selenium K edge, we typically use ∼1 sec for each
        energy that corresponds to the maximum absorp-  1 degree oscillation. At the bromine K edge, where
        tion of X-rays by pure selenomethionine. This value  the X-ray intensity from the first harmonic of the
        is used for all experiments that utilize selenome-  undulator is approximately 40% of that at the Se
        thionine to determine the required phases. With this  edge, the exposure time is doubled. When smaller
        approach, the limited X-ray lifetime of protein crys-  or larger oscillations are used, exposure times are
        talscanbedevotedtodeterminationofdiffraction. In  adjusted proportionately. These values are appro-
        addition to preserving crystals, this approach max-  priate for datasets that include data from an angular
        imizes the time devoted to data-collection in high-  wedge up to 180 degrees. For anomalous dispersion
        throughput mode.                             experiments, the amount of data collected generally
          It should be noted that the absolute energy cal-  increases by a factor of two. In these cases, exposure
        ibrations of beamlines vary. Determining the peak  times are typically reduced by a third, to preserve
        position of an element within a protein relative to a  sample integrity throughout the duration of data
        known standard (such as the metallic form of that  collection. Experience at SGX-CAT has shown that
        element) can save time in future structural experi-  this approach minimizes radiation damage while
        ments. Accurate determination of absorption edge  ensuring adequate diffraction intensity.
        energies for various metals has been reported by  Crystals with very strong diffraction may have an
        Kraft et al. (1996).                         unacceptably high number of saturated reflections.
                                                     Asnotedabove, suchcrystalsareidentifiedautomat-
                                                     ically during the crystal evaluation process, based
        12.6 Selection of exposure duration
                                                     on the average number of overloaded reflections on
        The exposure time used for each diffraction image  the screening images. For such crystals, the exposure
        represents a compromise between maximizing the  time is reduced. If a further decrease in the illumi-
        intensity of the diffraction signal and minimizing  nation of the sample is required, the intensity of the
        crystal degradation during data collection. Nave  incoming beam is adjusted.
        and Garman have provided a brief review of the
        current investigations on the sources of radiation  12.7 Sample tracking
        damage (Nave and Garman, 2005). Henderson esti-
        mated that the limiting X-ray dose for a protein  When large numbers of crystals are examined at syn-
                                7
        crystal is approximately 2×10 Grays (Gray = J/kg)  chrotron beamlines, unambiguous identification of
        (Henderson, 1990). Recentresultssuggestthatadose  the samples is critical. The SPINE standard includes
        50% higher than Henderson’s estimate can be tol-  a unique barcode on the magnetic base for that pur-
        erated by most protein crystals (Owen et al., 2006).  pose. However, the SPINE protocol also assumes
        The program RADDOSE can be used to estimate the  that the bases will be reused. Hence, these 2D
        maximum time that a crystal should remain in the  barcodes alone do not permit unique identification
        X-ray beam (Murray et al., 2004, 2005). Such calcu-  of a given crystal.
        lations rely on knowledge of both the characteristics  SGX uses two bar codes to track samples. The first
        of the beamline and the estimated composition of  identifier is the 2D bar code on the pin bases, which
        the unit cell. In addition, recent studies suggest that  are used multiple times to mount individual crys-
        there are significant variations in the X-ray dose that  tals. The second identifier, a 1D bar code, is placed on
        can be tolerated by the selenium in selenomethio-  the vials in which crystals are shipped to the beam-
        nine when determining diffraction phases through  line. This barcode is unique to the crystal and, unlike
        anomalous dispersion (Holton, 2007).         the base, is not reused. The device used to read the
          While it is possible to optimize exposure con-  barcodes is shown in Fig. 12.3. This system requires
        ditions for crystals individually, high-throughput  that the 1D barcode, which links the physical crystal
        efforts require an alternative approach. At SGX-CAT,  with its description in the database, constitutes part
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