Page 176 - Radiochemistry and nuclear chemistry
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160                  Radiochemistry and Nuclear Chemistry

                The  use  of  radioisotope  gauges  in  density  measurements  is  dependent  upon  (6.26)  in
               which  r  and  x  are  constant  while  the  absorption  coefficient  is  density  dependent  (i.e.
               dependent on the average atomic composition of the absorber).  A practical  arrangement  is
               illustrated in Figure 6.28,  E, where the density of a medium in a pipeline is measured.  This
               medium may be a mixture of gas and liquid such as water and water liquids with different
               composition  and  different  amounts  of dissolved  substances  as,  for  example,  oil,  salts  or
               acids  in water,  process  solutions in general or sludges,  and emulsions such as fruit juices,
               latex emulsions,  etc.  From the variation in density the concentration and composition may
               be determined.  Such density gauges are also used for control in filling of soft drink bottles
               and cans and submerged in rivers and lakes for measuring the depth of the bottom silt, etc.
               Density  gauges  are used  in  the production  and  the fabrication  of such diverse products  as
               automobile  tires and  cigarette packages.
                Thickness gauges are the most common type of instrument using the absorption technique.
               In this case x in (6.26) is varied.  Measurements can be carried out on all kinds of materials
               with thicknesses of  _< 100 g cm -2 and is independent of the temperature and of whether the
               material is stationary or in motion.  Figure 6.29,  F,  illustrates the application of a thickness
               gauge in a rolling mill where material of constant thickness is produced by using the signal
               from  the  detector  for  control  purposes.  Thickness  gauges  are  used  in  the  fabrication  of
               glass,  metal,  paper,  plastic,  rubber,  candy  bars,  etc.  They  have been used  for  measuring
               the  thickness  of snow in polar regions,  icing on airplane wings,  and  other applications  in
               which  it is necessary  to use remote operation.
                In order to measure very thin layers of material such as coatings of paint, wax, and plastic
               films on papers or other material, two thickness gauges are used with a differential coupling
               so  that  one  detector  measures  the uncovered  and the  other  the covered  or  treated portion
               of the material.  Thickness  gauges also are used in  industry to measure  the degree of wear
               in  industrial  machinery.  For  surface  measurements  of  thicknesses  <  0.8  g  cm -2  most
               thickness  gauges  use  radiation  sources  with/3-emitters  while  for  thicknesses  of 0.8-5  g
               cm -2  bremsstrahlung  radiation  sources  are  most  suitable.  For  even  thicker  materials
               7"emitters  are  used.
                Use  of reflection  gauges depends  on the  fact that the  intensity of the  scattered  radiation
               under  conditions of constant geometry depends on the thickness  of the scattering  material
               and its electron density (if/~- or -y-sources are used).  If neutrons are used the mass number
               of  the  scattering  material  is  of prime  importance.  The  electron  density  of the  scattering
               material  varies with the particular element and the chemical composition.  Frequently,  it is
               possible  to  determine  the  thickness  and  the  nature  of  a  surface  layer  by  means  of
               /~-scattering.  Reflection  gauges  have been  applied  to  on-line  analysis  of tin-covered  iron
               plates,  metal  coatings  on  plastics,  paint  layers,  and  to  measuring  the  protective  coating
               inside  pipelines  (Fig.  6.29,  G).  In  some instances  7-radiation  sources  are  preferred  over
               /~-emitters  in  measurements  of  material  with  greater  wall  thicknesses,  particularly  when
               transmission  measurements  are  not  feasible.  Steel  thickness  from  1  to  20  cm  has  been
               measured  with  5 % accuracy  using  backscattering  from 6~   or  137Cs sources  of 20/zCi
               intensity.
                Scattering  and reflection are dependent on  the electron density of the absorber,  which is
               approximately proportional to the value of Z/A.  Backscattering of/~-particles  from organic
               compounds is therefore very dependent on the hydrogen concentration (Z/A  =  1) but fairly
               independent  of  the  concentration  of  C,  N,  and  O  (Z/A  =  0.5).  This  has  led  to  the
               development  of  sensitive  instruments  for  hydrogen  analysis  for  various  organic  and
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