Page 535 - Sensors and Control Systems in Manufacturing

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Cha p te r
T e n

FIGURE 10.1
The SpectRx™ NIR
system. (Courtesy
of American
SensoRx, Inc.)

FIGURE 10.2
The SpectRx™ NIR
system installed in
pharmaceutical
production line.
(Courtesy of
American
SensoRx, Inc.)

FWHM full-width at half maximum
ILS instrument line shape
NIR near infrared
kb kilobyte (equals 1024 bytes)
Mb megabyte (equals 1,048,576 bytes)
MPD maximum path difference (in one direction of the
scan arm, or from ZPD)
NEP noise equivalent power
NESR noise equivalent spectral radiance
OD optical density
OPD optical path difference
RMS root mean square
RSS root Sum Square
SI Sabrie’s Index
SNR signal-to-noise ratio
ZPD zero path difference