Page 10 - Six Sigma for electronics design and manufacturing

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The binomial distribution
3.3.1
3.3.2
Examples of using the binomial distribution
86
86
The Poisson distribution
3.3.3
3.3.4
Examples of using the Poisson distribution
87
88
Attribute control charts limit calculations
3.3.5
89
3.3.6
Examples of attribute control charts
calculations and their relationship to
six sigma
Use of control charts in factories that are
3.3.7
91
approaching six sigma Contents 85
3.4 Using TQM Techniques to Maintain Six Sigma 91
Quality in Manufacturing
3.4.1 TQM tools definitions and examples 92
3.5 Conclusions 99
3.6 References and Bibliography 99
Chapter 4. The Use of Six Sigma in Determining the 101
Manufacturing Yield and Test Strategy
4.1 Determining Units of Defects 102
4.2 Determining Manufacturing Yield on a Single 104
Operation or a Part with Multiple Similar Operations
4.2.1 Example of calculating yield in a part with 105
multiple operations
4.2.2 Determining assembly yield and PCB and 106
product test levels in electronic products
4.2.3 PCB yield example 107
4.3 Determining Design or Manufacturing Yield on 108
Multiple Parts with Multiple Manufacturing
Operations or Design Specifications
4.3.1 Determining first-time yield at the electronic 110
product turn-on level
4.3.2 Example of yield calculations at the PCB 110
assembly level
4.3.3 DPMO methods for standardizing defect 112
measurements
4.3.4 DPMO charts 113
4.3.5 Critique of DMPO methods 115
4.3.6 The use of implied Cpk in product and 116
assembly line manufacturing and
planning activities
4.3.7 Example and discussion of implied Cpk in 118
IC assembly line defect projections
4.4 Determining Overall Product Testing Strategy 120