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            structure of a completely unknown substance, although this might be possible in certain cases, if a high
            resolution mass spectrometer is employed. An IR spectrum simultaneously produced by the GC/MS/IR
            triplet system would help significantly in the structure elucidation. The GC/MS system, however, can
            confirm the identity of a given solute with a high degree of confidence and for this purpose the GC/MS
            tandem system is most commonly used. Some supplier of mass spectrometers that have been employed
            with tandem instruments are given in Table 5.1.


            Synopsis

            The GC/MS combined instrument was introduced soon after the invention of GC itself, and initially, the
            mass spectroscopists looked upon GC as a novel sampling system for MS. In the early days, packed
            columns were used which required high flow rates, and thus sample concentrators were developed. The
            two most popular were the Ryharge concentrator, that operated on the principle of differential gas
            diffusion between concentric jets, and the Bieman concentrator, that operated on the principle of
            differential gas diffusion through a porous membrane. There are two popular types of ionizing
            processes used in GC/MS systems, electron impact ionization, and chemical ionization. Electrons,
            having energies between 5 and 100 V, are usually employed in electron impact ionization, and the ions
            formed are magnetically and/or electrostatically impelled into the analyzer region of the mass
            spectrometer. The accelerating voltage is adjusted to provide the optimum energy that would give the
            desired ion fragment pattern. Chemical ionization is achieved by producing ions from a reagent gas,
            such as methane by electron impact, and allowing the reagent ions to collide with sample atoms,
            producing sample ions. The ionization is gentle, (ca 5 eV), so very few fragment ions are produced, and
            those that are produced have m/z values close to that of the parent ion. Different reagent gases give
            different ions, and can provide different structural information. Most chemical ionization sources have a
            number of reagent gases available, and many ion sources can perform the dual role of electron impact
            and chemical ionization. The inductively coupled plasma ionization source, produces ions in an argon
            plasma maintained by inductively coupled rf energy, and about 50% all the elements present in the
            sample produce ions in the plasma region. The sample atoms account
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