Page 290 - An Introduction to Microelectromechanical Systems Engineering
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Glossary                                                                      269

                  Sacrificial etching  A micromachining processing method in which an inter-
                  mediate layer sandwiched between two layers of a different material is preferentially
                  (sacrificially) etched and selectively removed. Usually, the etch selectivity is high
                  between the intermediate layer and the two sandwich layers. The purpose of the sac-
                  rificial layer is to mechanically release one or both of the sandwich layers. Silicon
                  oxide is a commonly used sacrificial layer.
                  Silicon fusion bonding  Also known as silicon direct bonding, it is a process to
                  fuse or bond together two silicon substrates. The bond is strong, generally occurring
                  at the molecular level.
                  Silicon on insulator (SOI)  Substrates consisting of a thin layer of silicon dioxide,
                  typically 0.5 to 2 µm thick, sandwiched between two crystalline silicon layers. The
                  silicon dioxide is known as buried oxide. One method to fabricate SOI substrates is
                  by silicon fusion bonding a silicon wafer with a thin layer of silicon dioxide on its
                  surface to a bare silicon wafer, then thinning one of the silicon substrates. SOI is a
                  well-proven technology for the fabrication of CMOS electronic circuits suitable for
                  high-temperature operation (up to 300ºC), as well as for high-voltage (>100V) and
                  high-frequency (>10 GHz) applications.
                  Sheet resistance  The resistance of one square of material in units of Ω per square
                  (Ω/ ). It is equal to resistivity divided by the thickness of the material. For thick-
                  film resistors, it is generally implicit that the unit thickness is one mil (25.4 µm).
                  Solidus temperature see liquidus temperature.

                  Sound Power Level (SPL)   Sound pressure, in decibels, measured in reference to a
                  base sound pressure of 20 µPa in air. The reference is usually 1 Pa in water.
                  Sputtering   A process to deposit a thin film on the surface of a substrate. It
                  involves the removal of material from a target by ion bombardment and subsequent
                  redeposition on the substrate.
                  SRAM      An acronym for static random access memory, a type of electronic mem-
                  ory that can be arbitrarily addressed. Unlike EEPROM, it cannot hold the data once
                  electrical power is turned off.

                  Stiction  A well-known problem resulting from the geometrical scaling law when
                  surface adhesion forces are larger than the mechanical restoring forces of a sus-
                  pended micromachined structure.
                  Strain   In mechanics, a deformation produced by stress. In a beam, it is equal to
                  the change in length divided by the original beam length.
                  Surface micromachining   A class of fabrication processes yielding micromechani-
                  cal structures which are only a few micrometers thick, usually involving the removal
                  of a sacrificial layer.
                  Surface mount technology (SMT)    An advanced electronic packaging technol-
                  ogy in which the type of packages are particularly small so that they can be soldered
                  in high density on the surface of a printed-circuit board.
                  SVGA see VGA.
                  SXGA see VGA.
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