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leakage, in batteries, 130
content addressable (CAM), 97
learning, 79–81
machining and forming of chips for, 93–95 INDEX 301
least mean square (LMS) materials, 282–283 destructive readout in, 94
algorithm, 62–65 direct memory access (DMA)
maneuverability, 57
Legendre, 62, 63 mass, 40, 48 and, 104, 118
level one (L1)/level two (L2) downloading times and, 91
mass at heights (potential
cache memory, 97 energy), 31 dynamic random access
leverage and safety, 131 (DRAM), 93–98
materials, 282–287
leveraging existing technology, availability of, 284 energy and power supplies
75–76 in, 174
composites, 283
licensing of software and, 76 cost of, 284 flash type, 93
licensing software, 120 dynamic mechanics and, level one (L1)/level two (L2)
life testing, 144–145 cache, 97
288–290
limit of operations, testing fatigue in, 286 looping and, 96
for, 144 memory management unit
fiberglass, 283
linear regulators, 169–170 galvanic corrosion in, 285–286 (MMU) and, 92
liquid crystal display (LCD), 83 pages in, 92
heat transfer in, 290–291
load limits, communication, 260 lubrication and dirt, 286 PCMCIA cards for, 93
local area networks (LAN), 82, power failures, 182–183
machining and forming of,
102, 105–108, 272 random access (RAM),
10BT/100BT/1000BT 282–283 117–118
metals, 283
standards for, baseband, 106, natural frequencies and RAS/CAS cycle in, 95
232, 272 read only (ROM), 101,
vibration, 290
Aloha time division 117–118
communication systems plastics, 283 refresh time in, 94
resins, 283
in, 261 static random access (SRAM),
Ethernet and, 272 static mechanics and, 287–288 94–95
strength of, 284–285
infrared wireless, 107 static type, 93–94
Physical layer in, 272 strength to weight ratios in, 282 stored programs in, 90–91
tolerances for, 287
TCP error-free communication thrashing in, 97–98
in, 273 wood, 283 memory bus, 104
user datagram protocol (UDP) mathematics of reliability, 124 memory management unit
Maxwell, James Clerk, 138, 139
in, 273–274 (MMU), 92
wireless (802.11b), Maxwell’s Equations, 138 metals, 283
mean time between failure
106–107, 269 galvanic corrosion in, 285–286
locomotion system, 148 (MTBF), 110, 125 millions of instructions per
mean time to failure (MTTF),
Loebner Prize, 21 second (MIPS), 115–116
longevity 124, 125, 126 Minkowski, 67
display systems and, 112, 113 mean time to repair a failure mission statement, 14
hard disk drives and, 110 (MTTR), 125 mixed signal circuitry, 82–83
loops mechanical stress, 58 modems, 271
energy and power supplies mechanical threats and modulation, 232–238
in, 189 safety, 131 modulator/demodulator, 250,
memory and, 96 mechanical wracking, 53, 55, 58 251–252
low frequency and mechanics (See also materials), motor brakes, 186
interference, 139 281–291 motor force, in control
low pass filters in, 209, 210 memory, 79–81, 90–98, 117–118 systems, 31
lubrication, 286 addressing, 91–92, 95, 97 motors, 275–279
Lunar Excursion Module buses for, 104 AC motors, 275–276
(LEM), 154 cache, 95–98 braking in, 186