Page 27 - Building A Succesful Board-Test Strategy
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What Is a Test Strategy?  13






                     Stimulus
                       and | Shared
                     Response 1 Vectors
                      Vectors




 Figure 1-3  Because the assumptions are different, stimulus-and-response vector sets
 for logic simulation and test vector sets for fault simulation resemble the overlapping
 circles of a Venn diagram. Some vectors are unique to logic simulation, others are unique
 to fault simulation. Certain vectors will be common to both techniques.




 assuming that the product is built correctly. It therefore seeks only to ensure that
 an input stimulus that the board will experience in actual operation will produce
 the output pattern that the designer has specified.
    Fault simulation works the other way around. It assumes that the design is
 correct and attempts to determine whether the assembly process has built it prop-
 erly. If the board is built correctly, a particular set of inputs will produce a specific
 set of outputs. If it contains faults, some input vectors must produce incorrect sig-
 natures. Those incorrect signatures should pinpoint the exact cause of the problem.
    Because the assumptions are different, input vector sets are different as well.
 They resemble the overlapping circles of a Venn diagram, as shown in Figure 1-3.
 Some vectors are unique to logic simulation, others are unique to fault simulation.
 Certain vectors will be common to both techniques.
    When simulating a circuit for design verification, an engineer can apply
 vectors of unlimited flexibility. That is, issues such as resolution, access, and test
 times border on irrelevant. The object is to verify that, if the manufacturer pro-
 duces the board according to specification, that it will work the first time.
    When simulating for production test, the selected test equipment must be able
 to execute whatever vectors the engineer has proposed. Circuit access must be avail-
 able either directly through a bed-of-nails or from the edge connector or indirectly
 using a technique such as boundary scan. (See Chapter 5.)
    Perhaps the biggest difficulty with fault simulation is determining when it has
 covered all possible faults. Generally, there are very few ways to build a circuit cor-
 rectly and a plethora of faulty alternatives. For most complex circuits, the number
 of input vectors required to cover every conceivable failure mechanism is far greater
 than a simulator can apply in a reasonable amount of time.
    To estimate the fault coverage in a fault simulation, an engineer routinely
 injects faults into the simulated circuit, then ensures that the simulation process
 will uncover them. At some point, someone must decide that the fault-coverage
 percentage is the best it can be and move on.
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