Page 8 - Building A Succesful Board-Test Strategy
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Contents vii
4.10 Managing Transition 147
4.11 Other Issues 149
4.12 Summary 149
Chapter 5 Reducing Test-Generation Pain with Boundary Scan 151
5.1 Latch-Scanning Arrangements 151
5.2 Enter Boundary Scan 153
5.3 Hardware Requirements 158
5.4 Modes and Instructions 161
5.5 Implementing Boundary Scan 163
5.6 Partial-Boundary-Scan Testing 166
5.6.1 Conventional Shorts Test 167
5.6.2 Boundary-Scan Integrity Test 167
5.6.3 Interactions Tests 168
5.6.4 Interconnect Test 169
5.7 Other Alternatives 170
5.8 Summary ' 172
Chapter 6 The VMEbus extension for Instrumentation 173
6.1 VME Background
6.2 VXI Extensions
6.3 Assembling VXI Systems
6.4 Configuration Techniques
6.5 Software Issues
6.6 Testing Boards
6.7 The VXIbus Project
6.8 Yin and Yang
6.9 Summary
Chapter 7 Environmental-Stress Screening 199
7.1 The "Bathtub Curve" 199
7.2 What Is Environmental-Stress Screening? 201
7.3 Screening Levels 202
7.4 Screening Methods 202
7.4.1 Burn-in 202
7.4.2 Temperature Cycling 204
7.4.3 Burn-in and Temperature-Cycling Equipment 206
7.4.4 Thermal Shock 207
7.4.5 Mechanical Shock and Vibration 208
7.4.6 Other Techniques 210
7.4.7 Combined Screens 210
7.5 Failure Analysis 212
7.6 ESS Costs 212
