Page 244 - Design of Simple and Robust Process Plants
P. 244

230  Chapter 6 Process Design Based on Reliability
                6.2.2.3  The exponential distribution
                This distribution is frequently applicable to repairable systems, and is frequently
                used in reliability and safety studies. It implies that the failure rates are constant
                and independent, and so the mean time between consecutive failures is constant.
                Thus, the MTTF is equal to the MTBF. To illustrate this, when the bearings of a
                mechanical device fail and are repaired, the mean time to the next failure remains
                the same.
                  The exponential expression is R(t) = e ±k.t  or  F(t) = 1 ± R(t) = 1± e ±k.t ,
                where k is a constant failure rate.
                  Then, the expected number of failures in operating time period t is k t.

                6.2.2.4  The normal distribution
                The normal distribution is in relation to a stochastic variable which can have values
                between 1 and ±1. The probability density function is:
                        1        1 t l 2


                  f(t) = p  exp     ± 1 <t< 1
                       r 2       2  r
                where the variable is t,
                                                       2
                  The mean value is l, and the variance Var(t) = r .

                6.2.2.5  The log normal distribution
                This distribution is often applicable to reliability studies. The variable t is said to be
                log normal distributed if ln(t) is normally distributed. The probability density func-
                tion is now
                         1        … ln…t† l† 2
                  f(t) =  p  exp    2
                       tr 2         2r
                                  2

                  x mean = exp (l + 0.5r ) Var(t) = exp 2l ‡ r 2    exp r 2    1

                6.2.2.6  The Weibull distribution
                The Weibull distribution has a specific characteristic in that the distribution does
                not have a specific shape, but can have different shapes depending on the selection
                of a set of parameters. The distribution is commonly used in reliability analysis as it
                can describe decreasing, as well as increasing, failure rates. Earlier, we referred to
                the aging of components that are often covered in Weibull distributions.
                  The Weibull distribution for two parameters is defined as:
                           b 1   "    b  #
                       b t           t
                  F(t) =      exp        ,0 £ t< 1
                       g g           g
                Where b is called the shape parameter (dimensionless), and g is called the scale pa-
                rameter (dimension t). Increasing and decreasing failure rates are realized by the
                choice of the shape parameter b, where:
   239   240   241   242   243   244   245   246   247   248   249