Page 241 - Design of Simple and Robust Process Plants
P. 241

6.2 Basic Theory of Reliability  227

                      Turn around
                                       Time between
                      Planned process stops
                                          failures
                     Unplanned stops
                                       Mission time










                  0
                 t()                              Time
                Fig. 6.5. Time line for a process plant.

                With the constant failure rate, the relationship can be rewritten as:
                               t
                          h       i
                  R(t) = exp
                             MTBF
                  Unavailability U(t) is defined as:
                  U(t) = 1 ± A(t)                                              (4)
                  The unavailability due to failures (excluding regeneration stops) is expressed on a
                Markov technique.
                                                              1
                  When we write the mean time to repair MTTR as; h ˆ
                                                              l
                             k
                  U(t) =                                                       (5)
                       k‡l1 e   …k‡l†t
                derived by Markov analysis (Red book, 1997).
                                                              k
                  The limiting value average unavailability becomes: U=
                                                             k‡l
                  The formulae can be simplified:
                                    3              k
                  If  l>>k  and t      then  U(t) =
                                    l              l
                  Or  h << MTTF and t   3    then  U(t) = kh

                  As A(t) = 1 ± U(t), the availability is now known.
                                             R t
                  The number of failures is N(0,t) = x…t†dt
                                             0
                where x is the failure occurrence rate, which is the probability that a component
                fails during the next time interval, given that no failure will occur at time zero.
   236   237   238   239   240   241   242   243   244   245   246