Page 221 - Fiber Fracture
P. 221
206 H.U. Kunzi
600 30
t t
-
z 450 20 Y 5
a
s z
M c)
E cd
C
0
300 10 .s
z c
c M
.3
0
b Ei
150 0
0 200 400 600
Annealing temperature [" C] +
Fig. 20. Tensile strength and elongation at rupture for Cu wires of different diameters as function of the
annealing temperature.
3,P ,
Grain size l/,h [ 11fi 1 -
5
0.2 0.3 0.4 0.5 0.6
Fig. 21. Yield stress vs. reciprocal square root of the grain size d for 95 bm diameter Cu wires,
Recrystallization Kinetics of the Mechanical Properties
As shown in Fig. 22 the yield stress of polycrystalline wires is mainly dependent on
the microstructure. Starting with as-drawn wires the evolution of the microstructure is
