Page 226 - Handbook of Adhesives and Sealants

Quality Control and Nondestructive Tests 195

TABLE 5.6 Techniques for Studying Surface Structure and Composition 9

Technique Probe Species Description
ESCA Electron Spectroscopy for X-rays Chemical information
Chemical Analysis through line shape
analysis. Useful for
insulators and
conductors. Widely used
on polymers. Sample
may be damaged due to
X-rays.
SIMS Secondary Ion Mass Ions Semi-quantitative
Spectrometry elemental analysis.
Useful only for
conductors or Ionic
insulators. Sample is
severely damaged.
AES Auger Electron Spectroscopy Electrons Quantitative elemental
analysis tool for
determining surface
composition of
semiconductors and
conductors. Limited to
non-insulators.
ATR-FTIR Attenuated Total Infrared light Detailed chemical
Reflectance Fourier information. Non-vacuum
Transform Infrared method. Specimens must
Spectroscopy be flat and capable of
intimate contact with the
necessary crystal.
ISS Ion Scattering Spectroscopy Ions Information gained on
surface composition.
Elemental analysis with
single layer atomic
resolution.
XES X-Ray Emission X-rays Information on energy
Spectroscopy levels and chemical state
of adsorbed molecules;
surface composition.

By itself, SIMS has been shown to be a powerful tool for elemental
16
15
surface characterization by Benninghoven and Schubert and Tracy .
However, uncertain or rapidly changing secondary ion yield due to
changes in chemical bonding make quantitative analysis virtually im-
possible using SIMS alone. 17,18 SIMS is most helpful when combined
with other techniques, such as ISS and AES.
The greatest strength of ESCA (Electron Spectroscopy for Chemical
Analysis) lies in its ability to provide information on the surface chem-
istry of polymers or organics. 19 ESCA is also known as x-ray photo-
electron spectroscopy (XPS). The surface excitation produced by ESCA