Page 227 - Handbook of Adhesives and Sealants

196 Chapter Five

analysis is relatively non-destructive. AES is a useful high spatial res-
olution technique for the analysis of metals, alloys, and inorganic ma-
terials. Polymer and organic surfaces pose problems because of beam
damage and sample charging. ISS is also an elemental analysis tech-
nique with single atomic layer resolution and is often used in con-
junction with other surface techniques.

References

1. Smith, D. F., and Cagle, C. V., ‘‘A Quality Control System for Adhesive Bonding
Utilizing Ultrasonic Testing’’, in Structural Adhesive Bonding, M. J. Bodanr, ed.
(New York: Interscience, 1966).
2. Hiler, M. J., ‘‘Adhesive Failures: Reasons and Preventions’’, Adhesives Age, January
1967.
3. Hauser, R. L., et al., ‘‘Physical Analysis of Contact Adhesives’’, Adhesives Age, De-
cember 1994.
4. Hagemaier, D. J., ‘‘End Product Nondestructive Evaluation of Adhesive Bonded
Metal Joints’’, Adhesives and Sealants, vol. 3, Engineered Materials Handbook,
ASM International, 1990.
5. Botsco, R. T. and Anderson, R. T., ‘‘Nondestructive Testing: Assuring Reliability in
Critically Bonded Structures’’, Adhesives Age, May 1984 at 19–21.
6. Hitt, W. C., ‘‘Practical Aspects of Nondestructive Testing’’, Automation, June 1971
at 67–71.
7. Thomas, R. L. and Favro, L. D., ‘‘Thermal Wave Inspection of Adhesive Disbonding’’,
41st International Sample Symposium, March 1996 at 579.
8. Brett, C. L., J. Appl. Sci., 18:315 (1974).
9. Dillard, J. G., ‘‘Microscopic/Spectroscopic Studies in Adhesion Related to Durability
of Adhesive Bonded Metals and Composites’’, Adhesion Principles and Practice
Course, Kent State University, May 1998.
10. Baun, W. L., et al., ‘‘Chemistry of Metal and Alloy Adherends by Secondary Ion
Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy’’,
ASTM STP 596, American Society of Testing and Materials, Philadelphia, March
1975.
11. McDevitt, N. T., and Baun, W. L., ‘‘Some Observations of the Relation Between
Chemical Surface Treatments and the Growth of Anodic Barrier Layer Films’’,
AFML-TR-76-74, June 1976.
12. McDevitt, et al., ‘‘Surface Studies of Anodic Aluminum Oxide Layers Formed in
Phosphoric Acid Solutions’’, AFML-TR-77-55, May 1977.
13. McDevitt, et al., ‘‘Accelerated Corrosion of Adhesively Bonded 7075 Aluminum Us-
ing Wedge Crack Specimens’’, AFML-TR-77-184, October 1977.
14. Baun, W. L., et al. ‘‘Pitting Corrosion and Surface Chemical Properties of a Thin
Oxide Layer on Anodized Aluminum’’, AFML-TR-78-128, September 1978.
15. Benninghoven, A., Surface Sci., 28:541 (1971). In German.
16. Schubert, R. and Tracy, J. C., ‘‘A Simple and Inexpensive SIMS Apparatus’’, Rev. of
Sci. Inst., 44:487 (1973).
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12(1):505 (1975).
18. Werner, H. W., ‘‘Investigation of Solids by Means of an Ion Beam Bombardment
Mass Spectrometer’’, Dev. Appl. Spectroscopy, 7A:219 (1969).
19. Zhuang, H. and Gardella, J. A., ‘‘Spectroscopic Characterization of Polymer Sur-
faces’’, MRS Bulletin, 1996.