Page 269 - Handbook of Instrumental Techniques for Analytical Chemistry
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Infrared Spectroscopy                                                                      259



                                                 Figure 15.10 The “double-beam” IR spectrum of dibutyl
                                                 phthalate, produced by ratio of the corresponding single-beam
                                                 sample spectrum against the single-beam background
                                                 spectrum.






















                                   An FTIR instrument can achieve the same signal-to-noise (S/N) ratio of a dispersive spectrom-
                                   eter in a fraction of the time (1 sec or less versus 10 to 15 min). The
                                   S/N ratio is proportional to the square root of the total number of measurements. Because multi-
                                   ple spectra can be readily collected in 1 min or less, sensitivity can be greatly improved by in-
                                   creasing S/N through coaddition of many repeated scans.
                                 • Increased optical throughput (Jaquinot advantage). Energy-wasting slits are not required in the
                                   interferometer because dispersion or filtering is not needed. Instead, a circular optical aperture
                                   is commonly used in FTIR systems. The beam area of an FT instrument is usually 75 to 100
                                   times larger than the slit width of a dispersive spectrometer. Thus, more radiation energy is
                                   made available. This constitutes a major advantage for many samples or sampling techniques
                                   that are energy-limited.
                                 • Internal laser reference (Connes advantage). The use of a helium neon laser as the internal ref-
                                   erence in many FTIR systems provides an automatic calibration in an accuracy of better than
                                         –1
                                   0.01 cm . This eliminates the need for external calibrations.
                                 • Simpler mechanical design. There is only one moving part, the moving mirror, resulting in less
                                   wear and better reliability.
                                 • Elimination of stray light and emission contributions. The interferometer in FTIR modulates all
                                   the frequencies. The unmodulated stray light and sample emissions (if any) are not detected.
                                 • Powerful data station. Modern FTIR spectrometers are usually equipped with a powerful, com-
                                   puterized data system. It can perform a wide variety of data processing tasks such as Fourier
                                   transformation, interactive spectral subtraction, baseline correction, smoothing, integration,
                                   and library searching.
                                 Although the spectra of many samples can be satisfactorily run on either FTIR or dispersive instru-
                             ments, FTIR spectrometers are the preferred choice for samples that are energy-limited or when in-
                             creased sensitivity is desired. A wide range of sampling accessories is available to take advantage of
                             the capabilities of FTIR instruments.
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