Page 199 - Inorganic Mass Spectrometry - Fundamentals and Applications
P. 199
Secondury Ion Mass Spectrometry I85
10
t- I l I
l1
OS
M
Sn
Relative secondary negative ion yield (M- ) vs. atomic number of secondary
ion. CS+ primary beam. 0, pure element; A, compound; BD,, barely detectable; N.D., not
detected. (From Ref. 82.)
