Page 233 - Inorganic Mass Spectrometry - Fundamentals and Applications

218 Cristy

58. Clement, S. W. J. and Compston, W., in Secondary Ion Muss Spectrometry? SIMS VIZ,
Benninghoven, A., Evans, C. A., McKeegan, K. D., Storms, H. A., and Werner, H,
W., eds., John Wiley & Sons, Chichester, 815 (1990).
59. Stanford University Web Site: http://shrimprg.stunford. ed~MuinMenu. html
60. Conty, C., Rasser, B., and Migeon, H. N., in Secondury Ion Muss Spectrometry, SIMS
VIZ, Benninghoven, A., Evans, C. A., McKeegan, K. D., Storms, H. A., and Werner,
H. W., eds., John Wiley & Sons, Chichester, 831 (1990).
61. Hillion, F., Daigne, B., Girard, F., Slodzian, G., and Schuhmacher, M., in Secondary
Ion Muss Spectrometry, SIMS IX, Benninghoven, A., Nihei, Y., Shimizu, R., and
Werner, H. W., eds., John Wiley & Sons, Chichester, 254 (1994).
62. Dowsett, M. G., Smith, N. S., Bridgeland, R., Richards, D., Lovejoy, A. C., and
Pedrick, P,, in Secondary Ion Mass Spectrometry, SIMS X, Benninghoven, A., Ha-
genhoff, B., and Werner, H. W., eds., John Wiley & Sons, Chichester, 367 (1997).
63. Secondary Ion Muss Spectrometry: Proceedings of U ~orkshop on Secondary Ion
Muss Spectrometry and Ion Microprobe Muss Anulysis, Heinrich, K. F. J. and New-
of
bury, D. E., eds., National Bureau Standards Special Publication, Washington, DC,
427 (1975).
64. McHugh, J. A., in eth hods of Su~uce Anulysis, Czanderna, A, W., ed., Elsevier Sci-
entific, New York, 223 (1975).
65. Honig, R, E., in Secondary Ion Muss Spectrometry, SIMS V, Benninghoven, A.,
Colton, R. J., Simons, D. S., and Werner, H. W., eds., Springer-Verlag, Berlin, 2 (1986).
66, Bernius, M. T. and Morrison, G. H. Rev. Sci. Instrum., 58(10), 1789 (1987).
67. Secondary Ion Muss Spectrometry: Basic Concepts, Instrumentul Aspects, Applicu-
tions and Trends, Benninghoven, A., Rudenauer, F. G., and Werner, H. W., John Wiley
& Sons, New York (1987).
68. Secondary Ion Muss Spectrometry: Principles and Applicutions, Vickerman, J. C.,
Brown, A., and Reed, N. M., eds., Clarendon Press, Oxford, (1989).
69. Wilson, R. G., Stevie, F. A., and Magee, C. W., Secondary Ion Muss Spectrometry:
A Pructicul ~undbook for Depth Pro ling and Bulk I~purity Anulysis, John Wiley
& Sons, New York (1989).
70. Sigmund, P., in Topics in Applied Physics, Vol. 47, Sputtering by Particle Bombard-
ment, Behrisch, R., ed., Springer-Verlag, Berlin, 9 (1981).
71. Rol, P. K, Fluit, J. M,, and Kistemaker, J. ~~ysicu, 1009 (1960).
26,
72. Almen, 0. and Bruce, G., Nucl. Instr: Meth., 11,257 (1961).
73. Rol, P. K., Onderdelinden, D., and Kistemaker, J, Truns. Third Inte~utl. Vucuum
Congr:, Pergamon Press, 75 (1 966).
74. Wilson, R. G, and Brewer, G. R., Ion Beams, John Wiley & Sons, New York, p. 325
(1973).
75. McHugh, J. A. Rudiat. E', 21,209 (1974).
76. Hauffe, W., in Secondury Ion Muss Spectrometry? SIMS HI, Benning~oven,A., Giber,
J., Laszlo, J., Riedel, NI., and Werner, H. W., eds., Springer Verlag, Berlin, Heidel-
berg, New York, 206 (1982).
77. Wilson, R. G., Stevie, F. A., and Magee, C. W., Secondary Ion Muss Spectrometry:
A Practical ~undbook for Depth Pro ling and Bulk Impurity Anulysis, John Wiley
& Sons, New York, 2.7-4, (1989).