Page 230 - Inorganic Mass Spectrometry - Fundamentals and Applications

Secondary Ion Muss Spectrometry 215

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0 200 400 600 800 l000
DISTANCE (microns)
Superposition of secondary ion mass spectrometry (SIMS) concentration data
for SrO on theoretical surface diffusion curves. SrO had diffused for 473 hr at 693K. (From
Ref. 145.)

1. Wei, C. Y., Current, M. I., and Seidman, D. N., Philos. Mag. A, 14,459 (1981).
2. Heinisch, H. L., Philos. Mag A, 45, 1085 (1982).
3. Levi-Setti, R., Crow, G., and Wmg,Y. L., in Secondary Ion Muss Spectromet~, SIMS
V, Benninghoven, A., Colton, R. J., Simons, D. S., and Werner, H. W., eds., Springer-
Verlag, Berlin, 132 (1986).
4, Thornson, J. J., Philos. Mag., 20,252 (191 0).
5. Woodcock, K. S., Phys. Rev., 35, 1090 (1930).