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107. Secondary Zon Mass Spectrometry, SIMS XI, Gillen, G., Lareau, R., Bennett, J., Ste-
vie, F., eds., John Wiley & Sons, Chichester, 581 (1998).
108. Robinson, C. F., Andersen, C. A., and Roden, H. J., The Pittsburgh Conference,
Cleveland, Ohio, Paper #l22 (1969).
109. Okutani, T., Shinoyama, T., Ohshima, M., and Noda, T., in Secondary Zon Mass Spec-
trometry, SIMS V, Benninghoven, A., Colton, R. J., Simons, D. S., and Werner, H.
W., eds., Springer-Verlag, Berlin, 139 (1986).
110. Slodzian, G,, Chaintreau, M., and Dennebouy, R., in Secondary Ion Mass Spec-
trometry, SZMS V, Ben~nghoven, A., Colton, R. J., Simons, D. S., and Werner, H.
W., eds., Springer-Verlag, Berlin, 158 (1986).
111. Daly, N. R., Rev. Sci. Znstz,, 31,264 (1960).
112. Schwede, B. C., Heller, T., Rading, D., Niehuis, E., Hagenhoff, B., Wiedmann, L.,
and Benninghoven, A., in Secondary Zon Mass Spectrometry, SZMS XZ, Gillen, G.,
Lareau, R., Bennett, J., Stevie, F., eds., John Wiley & Sons, Chichester, 509 (1998).
113. Vickerman, J. C., Briggs, D., and Henderson, A., The Static SIMS ~i~rary, Surface
Spectra (1997).
114. Be~inghoven, A., Sur$ Sci., 35,427 (1973).
115. Chartogne, A. and Saldi, F., in Seconda~ Zon Mass Spectrometry, SZMS XI, Gillen,
G., Lareau, R., Bennett, J., Stevie, F., eds., John Wiley & Sons, Chichester, 943
(1998).
116. Barber, M., Vickerman, J. C., and Wolste~olme, J., Sur$ Sci., 68, 130 (1977).
117. Gillet, E., Channakhone, S., Matolin, V., and Gillet, M., Sur$ Sci., 152453, 603
(1985).
118. Karen, A., Man, N., Okumura, H., Okuno, K., Soeda, F., and Ishitani, A., in Sec-
ondary Ion Mass Spectrometry, SZMS X, Benninghoven, A., Hage~off, B., and
Werner, H. W., eds., John Wiley & Sons, Chichester, 481 (1997).
119. Dowsett, M. G., in Secondary Ion Mass Spect~ometry, SIMS XZ, Gillen, G., Lareau,
R., Bennett, J., Stevie, F., eds., John Wiley & Sons, Chichester, 259 (1998).
120. Wittmaack, K., Sur$ Inter$ Anal., 24, 389 (1996).
121. Smith, N. S., Dowsett, M. G., McGregor, B., and Phillips, P., in Secondary Zon Mass
Spectro~etry, SIMS X, Benninghoven, A., Hagenhoff, B., and Werner, H. W., eds,,
John Wiley & Sons, Chichester, 363 (1997).
122. Ronsheim, P. A., Lee, K. L., Patel, S. B., and Schuhmacher, M., in Secondary Ion
Mass Spectrometry, SIMS XZ, Gillen, G., Lareau, R., Bennett, J., S tevie, F., eds., John
Wiley & Sons, Chichester, 301 (1998).
123. Vanberkum, J. G. M., Collart, E. J. H., Weemers, K., Gravesteijn, D. J., Iltgen, K.,
Benninghoven, A., and Niehuis, E., J. Vac. Sci. Technol. B., 16,298 (1998).
124. Iltgen, K., Brox, O., and Benninghoven, A., in Secondary ion Mass Spectrometry,
SIMS XI, Gillen, G., Lareau, R., Bennett, J., Stevie, F., eds., John Wiley & Sons,
Chichester, 305 (1998).
125. Magee, C. W., Mount, G. R., Smith, S. P., Herner, B., and Gossmann, H. J., J. Vac.
Sci. Technol. B., 16,3099 (1998).
126. CAhlECA Technical Note, Shallow Depth Pro ling with the C~~CA ZMS 6A 1 1
(1998).