Page 330 - Sami Franssila Introduction to Microfabrication
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                            Tools for Microfabrication








           The size of the microfabrication tools tends to be  In batch processing, uniformity over the batch must
           inversely proportional to the size of the structures they  be added to uniformity across the wafer. Variation
           make. Small tabletop instruments can pattern and etch  comes from wafer position in a batch system: flow
           3 µm lines, but tools for 100 nm lines require garage-  patterns of gases and liquids over wafers depend on
           sized behemoths with multimillion-dollar price tags. The  wafer position, and the thermal environment may also be
           analogy with elementary particle physics is obvious:  position dependent: the first and the last wafer have only
           the smaller the objects being studied, the bigger the  one neighbour, but the others are sandwiched between
           instruments needed. Price tags for individual tools are  two wafers.
           up to 10 million dollars today, even though $100 000 can  During the 3 in. era, most wafer processing was
           still buy a system suitable for research purposes, be it a  batch processed and the major shift started at the
           mask aligner, a furnace or a plasma etcher.  100 mm wafer size. Robotic loading/unloading is simple
                                                       in single-wafer systems, and they are more amenable
                                                       to factory automation, including data gathering. Film
           30.1 BATCH PROCESSING VERSUS
           SINGLE-WAFER PROCESSING                     thicknesses have been scaled down with linewidths, and
                                                       thinner films require less process time in deposition
           Microfabrication economies were earlier touted to  and etching, which works in favour of single-wafer
           result from batch processing: tens of wafers with  processing. However, single-wafer systems rarely even
           hundreds of chips are processed simultaneously in, for  approach batch system throughputs, which can be up to
           example, a furnace or a wet etch bench. However,  200 wafers per hour (WPH) and in some simple PECVD
           the scaling down of linewidths has put increasing  applications (in solar cells), even 500 WPH. It may also
           demands on process control, and single-wafer tools have  well be that in the back end of the process, wafers are
           superseded batch equipment in many process steps.  so expensive that manufacturers do not want to risk a
           Besides, batch equipment for large wafers can become  lot by batch processing: 200 mm wafers with 300 chips
           prohibitively cumbersome.                   selling for $10 are worth $2500 (yield is not 100%), or
             Wet processing in a tank is a prototypical batch  the batch of 25 is worth $60 000. If a batch is lost at
           process: a full cassette of wafers is processed simul-  the end of the process, it will take time to fabricate the
           taneously (see Figure 12.3). Wafer cleaning and non-  replacement lot, typically three to six weeks. This can be
           patterning etching (e.g., removal of sacrificial oxide  an even greater burden than the money loss if delivery
           by HF) are widely done in batch-mode wet process-  time is used as a criterion for choosing a chip supplier.
           ing, even in the most advanced processes. Wet etching  In single-wafer processing, wafer-to-wafer repeatabil-
           for patterning (e.g., H 3 PO 4 -based aluminium etching or  ity is a major issue. First-wafer effect means that the
           BHF-etching of oxide) is not an option when linewidths  system has not stabilized, and therefore the first wafer
           are below 3 µm, because process control is difficult in  experiences, for example, lower temperature or more
           batch wet processing: no in situ monitoring is possi-  concentrated chemicals. In addition to batch and single-
           ble and wafer-to-wafer variations are often encountered.  wafer processing, various combinations are being used,
           However, model-based control with ionic strength and  as shown in Table 30.1.
           temperature measurement can be used to improve rate  Single-feature processing is so slow that it is relegated
           control to some extent.                     to special applications only. Throughputs of a few

           Introduction to Microfabrication  Sami Franssila
            2004 John Wiley & Sons, Ltd  ISBNs: 0-470-85105-8 (HB); 0-470-85106-6 (PB)
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