Page 339 - Sami Franssila Introduction to Microfabrication
P. 339

318 Introduction to Microfabrication




                                           135                                251
                            138          138                  245
                                                                251  257     257
                                                                          262
                            142
                              145                                           268
                                             145
                  142   151
                                                                       268
                    145         148      142                262
                                                                                      262
                                       145
                                            142
                                                           257    268              268
                          148     151                           273
                  138                         138               279      284
                         145  142                                               273     257
                                              135
                                                         251            279
                                           132
                                                            245            257
                                          129                       251  257   245
                        138                                    262
                           129   135                                              251
                              132
                                  (a)                                     (b)
            Figure 31.3 Rapid-thermal oxidation uniformity: (a) vertical lamp bank geometry can be seen in oxide thickness chart
            and (b) gas-flow patterns are seen in oxide thickness: incoming gas cools the wafer near the flat, and wafer edges are
            cooler than the centre. Reproduced from Deaton, R. & Massoud, Z. (1992), by permission of IEEE


              Metal chamber RTP tools are water-cooled to keep
            them cold; quartz chambers are allowed to heat up;
            that is, they are warm-wall systems. System walls do
            not contribute to contamination because evaporation and  1000°C
            desorption of material is minimized by keeping the
            temperature low.                              Temp
              A hybrid technology between resistively heated  800°C
            furnaces and RTA is the fast ramp furnace. A heater,
            typically made of silicon carbide, is kept at a very
            high temperature, and the wafers are rapidly brought
            to its vicinity. A massive radiation source emits at           30 s         60 s
            much longer wavelengths than RTP lamps, and thermal                Time
            equilibrium is possible. This ramping arrangement can
            significantly reduce wafer emissivity variation and  Figure 31.4 Temperature profile in rapid-thermal anneal-
                                                                          ◦
            temperature non-uniformities. Ramp rates for fast-  ing: solid curve: 1000 C, 10 s anneal; dashed curve:
                                                            ◦
            ramping systems are 10 to 100 C/s, somewhat lower  1100 C spike anneal (zero-time anneal)
                                     ◦
            than in RTP systems.
              Rapid annealing times are typically tens of seconds
            (Figure 31.4), very fast compared to 30 to 60 min furnace  The main features of furnace and RTP systems are
            anneals. In order to reduce unwanted diffusion during  compared in Table 31.2.
            annealing, high temperature/short time combination has  When oxide thicknesses are scaled down, rapid-ther-
            been refined to zero-time anneal (also known as spike  mal oxidation becomes more competitive but furnaces
            anneal): the anneal temperature refers to the highest  are still the workhorses of oxidation. In implant
            temperature reached by the system, but power is turned  activation anneal, RTA is the only choice when shallow
            off immediately after reaching that temperature.  junctions are made, as discussed in Chapter 25.
   334   335   336   337   338   339   340   341   342   343   344