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Osiander / MEMS and microstructures in Aerospace applications  DK3181_c007 Final Proof page 131 1.9.2005 12:03pm




                    Microtechnologies for Science Instrumentation Applications      131


                                                 15 mm




                                                                      collimator
                                                                      aperture
                         top energy
                         selector mask                               collimator


                         bottom energy                                electrostatic  8 mm
                         selector mask                                analyzer

                         MCP
                          anode

                    FIGURE 7.3 Cross-section of the FlaPS sensor-head-array (+8 pixel elements shown). (Source:
                    JHU/APL.)



                    of single-crystal silicon die with an array of 50-mm wide and 4.2-mm long channels,
                    as shown in Figure 7.4a. These die are bonded so that each channel is in the center
                    of an array of 200-mm wide channels that have been micromachined in CuBe using
                    electrical discharge machining (EDM), as shown in Figure 7.4b. Each of the five
                    pixels defining the sensor-head-array was micromachined at selected angles with
                    respect to the normal plane of incidence to achieve a maximum FOV of +88.The
                    total thickness of the collimator is 2.75 mm, which with the input channels results in
                    a18 acceptance angle and a transmission of 11% per detector. Before entering and
                    exiting the electrostatic analyzer, the particles encounter entrance and exit apertures
                    which act as energy selector masks. For a given electric field in the electrostatic
                    analyzer, only particles of a given energy pass through both apertures. The design




















                    FIGURE 7.4 (a) FlaPS analyzer entrance aperture and (b) EDM machined analyzer
                    electrodes. (Source: JHU/APL.)




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