Page 320 - MEMS and Microstructures in Aerospace Applications
P. 320

Osiander / MEMS and microstructures in Aerospace applications  DK3181_c014 Final Proof page 314 1.9.2005 12:47pm




                   314                       MEMS and Microstructures in Aerospace Applications



                   TABLE 14.2
                   Mission-Specific Environments 30

                                       Mercury  Venus   Earth    Mars      Jupiter
                   Average temperature (8C)  350  465  15        63       144
                   Diurnal temperature   173 !452  0   10 !20    133 !27
                     range (8C)
                                  2
                   Solar irradiance (W/m )  9127  2660  1380    595      51
                   Surface pressure   10   9  mbar  95 bar  1013 mbar  6.1 bar   100 bar
                   Other considerations  Vacuum  H 2 SO 4  H 2 O  Oxidants,  Aerosols:
                                       environment               dust      NH 3 ice, H 2 O ice,
                                                                           NH 4 SH




                   TABLE 14.3
                   Launch Vibrations (All Entries in Grams) 31,32
                   Vehicle                      Axial Load (g)             Lateral Load (g)

                   T34D/IUS                        +4.0                        +5.0
                   Atlas-II                         5.5                        +1.2
                   Delta                            6.0                          3.0
                   H-II                            +5.0                        +1.0
                   Ariane ASR44L                    4.5                        +0.2
                   Shuttle                          3.5                          3.4
                   Pegasus                          13                         +6



                   14.5.2 SHOCK
                   Shock differs from vibration in that shock is a single mechanical impact event
                   where mechanical energy is directly transferred into the device. MEMS devices will
                   fail when the shock event exceeds a critical stress and causes a fracture or adhesion
                   and delamination failures. Shock events can also cause stiction failures when the
                   induced displacement exceeds the critical design displacement and causes the
                   microstructure to touch the substrate or another microstructure. Most MEMS
                   devices are capable of surviving high shocks, but failures often occur from the
                   device packaging. Shearing off of the PC-board, package cracking, or wire bond
                   shearing are typical failure mechanisms. Encapsulation potting can be used to help
                   mitigate these effects. COTS accelerometers have been tested up to 120,000 g. 16–19


                   14.5.3 TEMPERATURE
                   Space missions typically require that a MEMS device be exposed to extreme
                   temperature changes. Internal stresses and many material properties are temperature-
                   dependent. Unfortunately most MEMS material properties are taken at room




                   © 2006 by Taylor & Francis Group, LLC
   315   316   317   318   319   320   321   322   323   324   325