Page 84 - Materials Chemistry, Second Edition
P. 84

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            2.3. The Crystalline State

              Another way to represent the structure factor is shown in Eq. 18, where r(r) is the
            electron density of the atoms in the unit cell (r ¼ the coordinates of each point in
            vector notation). As you may recall, this is in the form of a Fourier transform; that is,
            the structure factor and electron density are related to each other by Fourier/inverse
            Fourier transforms (Eq. 19). Accordingly, this relation is paramount for the deter-
            mination of crystal structures using X-ray diffraction analysis. That is, this equation
            enables one to prepare a 3-D electron density map for the entire unit cell, in which
            maxima represent the positions of individual atoms. [41]
                          Ð
              ð18Þ   F hkl ¼ rðrÞe 2piðhuþkvþlwÞ dV
                          V
                           Ð                     1  P P P
              ð19Þ   rðrÞ¼  F hkl e  2piðhuþkvþlwÞ  dV =  F hkl e  2piðhuþkvþlwÞ
                                                V
                                                   h  k  l
                           V
            It is noteworthy that the units of functions related by a Fourier transform are recipro-
            cals of one another. For instance, consider the reciprocal relationship between the
            period and frequency of a wave. Whereas the former is the time required for a
            complete wave to pass a fixed point (units of sec), the latter is the number of waves
                                             1
            passing the point per unit time (units of s ). Similarly, the unit of the structure factor
                                               ˚  1
             ˚
            (A) is the inverse of the electron density (A ). Since the experimental diffraction
                                            2
            pattern yields intensity data (equal to |F| ), the spatial dimensions represented by the
            diffraction pattern will be inversely related to the original crystal lattice.
              Accordingly, the observed diffraction pattern represents a mapping of a secondary
            lattice known as a reciprocal lattice; conversely, the “real” crystal lattice may only
            be directly mapped if one could obtain high enough resolution for an imaging device
            such as an electron microscope. The reciprocal lattice is related to the real crystalline
            lattice by the following (as illustrated in Figure 2.43):
            (i) For a 3-D lattice defined by vectors a, b, and c, the reciprocal lattice is defined by
               vectors a*, b*, and c* such that a* ⊥ b and c, b* ⊥ a and c, and c* ⊥ a and b:

                               b   c            a   c            a   b
                 ð20Þ   a ¼              b ¼              c ¼
                             ½a  ðb   cފ    ½a  ðb   cފ     ½a  ðb   cފ
               Recall that the cross-product of two vectors separated by y results in a third
               vector that is aligned in a perpendicular direction as the original vectors.
               For instance, for b   c, the magnitude of the resultant vector would be |b||c|
               sin y, and would be aligned along the a axis. This is in contrast to the dot-product
               of two vectors, which results in the scalar projection of one vector onto the other,
               of magnitude |b||c| cos y for b • c. For instance, for a cubic unit cell, the
               denominator terms in Eq. 20,[a •(b   c)], would simplify to:

               b   c ¼ |b||c| sin 90 ¼ |b||c|, aligned along the a axis;


               ∴ [a • b   c] ¼ |a||b||c| cos 0 ¼ |a||b||c|, or the volume of the unit cell
               As you might have noticed, the magnitude of a reciprocal lattice vector is in units
               of [1/distance], relative to the basis vectors in real space that have units of
               distance.
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