Page 141 - Nanotechnology an introduction

Abbreviations

AES Auger emission spectroscopy
AFM atomic force microscope or microscopy
AIC algorithmic information content
APED alternating polyelectrolyte deposition
APFIM atom probe field ion microscopy
APT atomically precise technologies
bce before the Christian era
CMOS complementary metal–oxide–semiconductor
CNT carbon nanotubes
CVD chemical vapor deposition
DFT density functional theory
DLA diffusion-limited aggregation
DNA deoxyribonucleic acid
DPI dual polarization interferometer
DPN dip pen nanolithography
EA evolutionary algorithm
ECM extracellular matrix
EDS, EDX energy dispersive spectroscopy
ESEM environmental scanning electron microscope or microscopy
FET field effect transistor
FIB fast atom bombardment
GBD generalized ballistic deposition
GMR giant magnetoresistance
IEC interactive evolutionary computation
IT information technology
LB Langmuir–Blodgett
LS Langmuir–Schaefer
MBE molecular beam epitaxy
MEMS micro-electromechanical systems
MMC metal–matrix composites
MOSFET metal–oxide–semiconductor field effect transistor
MRAM magnetic random access memory
MST microsystems technology
MTJ magnetic tunnel junction
MWCNT multiwalled carbon nanotubes
NEMS nano-electromechanical systems
NSOM near-field scanning optical microscope or microscopy
OWLI optical waveguide lightmode interferometry
OWLS optical waveguide lightmode spectroscopy
PDB protein data bank
PECVD plasmon-enhanced chemical vapor deposition
PN productive nanosystems, personal nanofactory
PSA programmable self-assembly
PVD physical vapor deposition
QCA quantum cellular automaton
QD quantum dot
RFN random fiber network
RLA reaction-limited aggregation
RNA ribonucleic acid
RRAM resistive random access memory
RSA random sequential addition or adsorption
RWG resonant waveguide grating
QCA quantum cellular automatom
QD quantum dot
SAM self-assembled monolayer
SAR scanning angle reflectometry
SEM scanning electron microscope or microscopy
SET single electron transistor
SFG sum frequency generation
SICM scanning ion conductance microscope or microscopy
SIMS secondary ion mass spectroscopy
SMEL sequential minimization of entropy loss
SNOM scanning near-field optical microscope or microscopy
SPM scanning probe microscope or microscopy
STEM scanning transmission electron microscope or microscopy
STM scanning tunneling microscope or microscopy
SWCNT single wall carbon nanotubes
TEM transmission electron microscope or microscopy
TIM thermal interface materials
UPMT ultraprecision machine tool
VLSI very large scale integration