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Interacting Subsystems
                             two processes involved in sequence and thus we must go beyond first
                             order perturbation theory.  The consequence is that the two transition
                             probabilities for the processes multiply to give the total transition proba-
                             bility and thus we may immediately identify indirect interband transi-
                             tions as less probable.

                             Intra-band transitions are indicated as (A) in Figure 7.9, e.g., between the
                             heavy hole and light hole valence band. In this case the electrons change
                             from one subset to another and remain in the same band. We therefore
                             count these processes for the same category as the interband transitions.
                             A very important process is the so called free carrier absorption. The
                             electrons remain in their subset of either the valence or conduction band.
                             These processes have to be distinguished from transport effects happen-
                             ing inside a subset of a band.

                             Emission of photons from electron in the conduction band has been
                             observed even from within industrially applied devices. Due to sub-
                             micron gate lengths in modern Field Effect Transistors the electric field
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                             under certain operating conditions can exceed  10 Vcm⁄  . Some of the
                             carriers accelerated by such field strengths may gain up to 1 eV in energy.
                             A small fraction of these carriers has been shown to be able to give up
                             this kinetic energy by emission of a photon. A pretty illustration of this
                             light emission is found in [7.18]. A ring oscillator consisting of 47 invert-
                             ers, as it is usually found in microprocessor clocks, has been observed by
                             means of a photomultiplier. A time integrated image of the ring oscillator
                             shows infrared and far infrared activity spatially resolved in the single
                             drain regions of the inverter devices.  This observation technique is
                             assumed to become even a standard diagnostic tool for monitoring the
                             functionality of modern integrated circuit devices [7.18].


                             7.4.2 Semiconductor Lasers
                             We start our discussion on the laser effect in semiconductors with a short
                             explanation of the principle effect by means of a two level atom model.



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