Page 132 - Introduction to Statistical Pattern Recognition
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114                        Introduction to Statistical Pattern Recognition



                           When  pi=  1,  Var(sIoi} =mo?+2o?[(rn-l)+ ...+ l]=rn20?.  There-
                      fore, the error of  the sequential classifier is the same as the one of  a classifier
                      with a single observation, regardless of the value of  in.
                           Multi-sensor fusion: The multi-sensor fusion problem  may  be  handled
                      in  a similar way  as the sequential test.  Suppose that  in different sensors (such
                      as radar, infrared, and so on) are used  to  gather data, and the  ith  sensor gen-
                      erates  a  vector  Xi  with  ki  measurements.  Then,  we  form  a  vector  with
                      (k, + . . . + k,)  component‘s, concatinating  XI, . . . ,X,.   However,  often  in
                      practice, X, , . . . ,X,  are mutually independent.  Therefore, the Bayes classifier
                      becomes





                                                                  o1   P,
                                                                  ><  ln-,       (3.183)
                                                                  03    p2

                      where - In px, (Xi I o1 )/px, (Xi I  02) is  the minus-log  likelihood ratio for the  irh
                      sensor  outputs.  The  Bayes  classifier  for  the  multi-sensor  system  can  be
                      designed by  computing the minus-log likelihood ratio for each individual sen-
                      sor  outputs,  adding these  ratios,  and  thresholding  the  summation.  Note  that
                      (3.183)  is  similar  to  (3.175).  However,  there  is  a  difference  between  the
                      multi-sensor and  sequential  classifiers in  that  each  likelihood function  is  dif-
                      ferent  for  the  multi-sensor classifier, while  it  is  the  same  for  the  sequential
                      classifier.  When  the  outputs  of  different  sensors  are  correlated,  we  need  to
                      treat the problem in the (k I + . . . +k,)-dimensional  space.

                      The Wald Sequential Test

                           Wald  sequential test: Instead of  fixing in, we  may terminate the obser-
                      vations when s of (3.175) reaches a certain threshold value.  That is

                                       s,,  2 a   +X’s  E  01  ,
                                     a  < s,,  < h  + take the (rn+l)th sample ,   (3.184)

                                       h I s,,   + X’s  E  w2  ,
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