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 Encyclopedia of Physical Science and Technology  EN009I-420  July 10, 2001  15:8







              Mesoporous Materials, Synthesis and Properties                                              377

              size. Changes in these synthesis parameters can be used
              to tailor the pore size.



              VI.  CHARACTERIZATION TECHNIQUES
                 AND PROPERTIES

              Many different techniques are used to characterize mes-
              oporous  materials.  Often  several  techniques  are  used
              in  combination,  in  order  to  provide  conclusive  struc-
              tural information. The most valuable methods for stru-
              cture elucidation include powder x-ray diffraction (XRD),
              transmission electron microscopy (TEM), scanning elec-
              tron microscopy (SEM), and adsorption (porosity) mea-
              surements.
                Powder XRD provides direct information on the pore
                                                                FIGURE 8  Powder X-ray diffraction pattern of MCM-48 meso-
              geometry and structural ordering of materials. Due to the
                                                                porous material. The peaks are indexed according to cubic (space
              limited ordering in mesoporous materials, the diffraction  group Ia3d ) geometry.
              patternsonlyhavereflectionpeaksinthelow-angleregion,
              i.e., 2-theta degrees (2θ/ ) between 1 and 10. No reflec-
                                 ◦
              tions are seen at higher angles because the pore walls are  TEM is a powerful technique for visualizing the pore
              largely amorphous. The ordering observed by XRD lies  ordering in mesoporous materials. Figures 9 and 10, for
              in the pore structure rather than in the pore walls. For-  example, show the TEM images of MCM-41 at two differ-
              tunately, the low-angle diffraction peaks are sufficient to  ent projections. TEM images are useful in estimating the
              allowindexingaccordingtoporegeometry.Atypicalpow-  pore size, and wall thickness, and in detecting any defects
              der XRD pattern for MCM-41 is shown in Fig. 7. Figure 8  in the pore structure. SEM is used to identify particle size
              shows a typical XRD pattern for a well-ordered MCM-48  and morphology.
              material.                                           Adsorption techniques are used to determine the poros-
                                                                ity and pore uniformity of the materials. It is possible from
                                                                the adsorption data to calculate a number of important tex-
                                                                turalpropertiessuchassurfacearea,porevolume,andpore




























              FIGURE 7  Powder X-ray diffraction pattern of MCM-41 meso-
              porous material. The peaks are indexed according to hexagonal  FIGURE 9 TEM image of MCM-41 as viewed down the pore axis.
              (space group p6m) geometry.                       The pore ordering can be clearly observed.
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