Page 126 - Mechanical Engineers' Handbook (Volume 2)
P. 126

Bibliography  115

                           thickness between the two plates, and k is a proportionality constant. The range of a capac-
                           itance sensor can be shown to remain linear with changes in area but become nonlinear when
                           the change in gap displacement becomes a significant portion of the original gap.
                              Again, it should be pointed out that advantages of small size and enhanced dynamic
                           response are to be found with resistance bridge transducers. Increased sensitivity will be
                           displayed by impedance bridge transducers. Both impedance bridges and ac-powered resis-
                           tance bridges offer noise suppression through separating non-self-generating responses from
                           self-generating responses.



            REFERENCES
                            1. P. K. Stein, Measurement Engineering, Stein Engineering Services, Phoenix, AZ, 1964.
                            2. W. M. Murray and P. K. Stein, Strain Gage Techniques, Engineering Extension UCLA and Society
                              for Experimental Stress Analysis, 1953.
                            3. C. C. Perry and H. R. Lissner, The Strain Gage Primer, 2nd ed., McGraw-Hill, New York, 1962.
                            4. R. C. Dove and P. H. Adams, Experimental Stress Analysis and Motion Measurements, Charles E.
                              Merrill Books, Columbus, OH, 1964.
                            5. A. L. Window and G. S. Hollister, Strain Gauge Technology, Applied Science Publishers, London
                              and New York, 1982.
                            6. P. L. Walter, ‘‘Deriving the Transfer Function of Spatial Averaging Transducers,’’ ISA Transactions
                              19(3) (1980).
                            7. ‘‘Temperature Compensation of Bridge Type Transducers,’’ Statham Instrument Notes Number 5,
                              Gould, Oxnard, CA, August 1951.
                            8. TECHNICAL DATA TD4354-1, ‘‘When and How—Semiconductor Strain Gages,’’ BLH Electronics,
                              Waltham, MA, June 1975.
                            9. ‘‘End-to-End Test Methods for Telemetry Systems,’’ Document 118-79, in Test Methods for Telem-
                              etry Systems and Subsystems, Vol. 1, Secretariat, Range Commanders Council, White Sands Missile
                              Range, NM, 1979.
                           10. ‘‘Test Methods for Vehicle Telemetry Systems,’’ Document 118-03, in Test Methods for Telemetry
                              Systems and Subsystems,’’ Vol. 5, Secretariat, Range Commanders Council, White Sands Missile
                              Range, NM, 2003.
                           11. J. W. Jaquay, ‘‘Understanding DC Instrumentation Amplifiers,’’ Instruments and Controls, September
                              1972.
                           12. P. K. Stein, ‘‘A Unified Approach to Handling of Noise in Measuring Systems,’’ AGARD LS-50,
                              NATO, Nevilly-sur-Seine, France, September 1972.
                           13. P. K. Stein, ‘‘Information Conversion as a Noise Suppression Method,’’ Lf/MSE Publication 66,
                              Stein Engineering Services, Phoenix, AZ, January 1975.



            BIBLIOGRAPHY
                           Dally, J. W., W. F. Riley, and K. McConnell, Instrumentation for Engineering Measurements, Wiley,
                             New York, 1988.
                           Doebelin, Ernesto O., Measurement Systems: Application and Design, McGraw-Hill Science/
                             Engineering/Math; 5th Pkg edition, ISBN: 007292201X (June 4, 2003).
   121   122   123   124   125   126   127   128   129   130   131