Page 253 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
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THERMAL  SENSORS     233

   example,  types  B,  E,  J,  K,  N,  R,  S,  and  T.  Typically,  they  can  operate  from  —100 to
                                                                            7
   +2000 °C with an accuracy  of between  1 and  3 percent for  a full-scale  operation  (FSO).
     Here,  we  are  mainly  interested  in  whether  a  temperature  sensor  can  be  integrated  in
   a  silicon  process  to  become  either  a  temperature  microsensor  or  part  of  a  silicon-based
   MEMS  device.  Table  8.2  summarises  the  typical  properties  of  conventional  temperature
   sensors  and,  more  importantly,  whether  they  can be  integrated  into  a  standard integrated
   circuit  (1C) process.
     As  is  apparent  from  Table  8.2,  it  is possible  to  integrate resistive  temperature  sensors
   such as the platinum Pt-100. However,  the  deposition  of platinum  or the thermistor  oxide
   is  a nonstandard  IC  process  and  therefore  requires  additional  pre-  or  post-IC  processing
   steps.  The  inclusion  of  nonstandard  materials  during,  for  example,  a  CMOS  process,
   which is  'intermediate'  CMOS,  is generally regarded  as highly undesirable and should be
   avoided  if  possible.
     It  is  possible  to  fabricate  silicon  resistors  in  standard  silicon  IC  process,  as  described
   in  Chapter  4.  For  example,  five  or  more  resistors  can  be  made  of  doped  silicon  in  a
   standard  bipolar  process,  such  as  a  base  resistor,  emitter  resistor,  or  an  epi-resistor,  and
   two  or three resistors can be made in a  CMOS  process  (see  Figure  4.15). The resistivity
   of  a  single  crystal  of  silicon  varies  with  temperature  and  doping  level,  as  illustrated  in
   Figure  8.6,  and the lightly doped  silicon provided  the highest  TCR.  In practice,  it is  diffi-
                                                           12   -3
   cult to make  single-crystal silicon with an impurity  level  below  ~10  cm ;  therefore,  it
   will not  behave  as an intrinsic semiconductor  with a well-defined Arrhenius  temperature-
   dependence  because the intrinsic carrier  concentration  is about  10 10  cm -3  at room  temper-
                                            -3
                                      18
   ature. In highly doped silicon resistors (~10  cm ), the temperature-dependence  approx-
   imates  reasonably  well  to  the  second-order  polynomial  given  in  Equation (8.1).  Never-
   theless,  the  temperature-dependence  of  a  silicon  resistor  is  nonlinear  and  depends  upon
   the  exact  doping  level,  making  it less  suitable  for  use as a temperature  sensor  than  other

   Table  8.2  Properties  of common  temperature  sensors and their suitability for integration. Modified
   from  Meijer  and  van  Herwaarden  (1994)

   Property       Pt  resistor    Thermistor     Thermocouple    Transistor
   Form  of  output  Resistance   Resistance     Voltage         Voltage
   Operating  range  Large  -260  to  Medium  —80 to  Very  large  —270  Medium —50
    (°Q             +  1000         + 180          to  +3500       to  +180
   Sensitivity    Medium  0.4%/K  High 5%/K      Low  0.05  to   High  ~2  mV/K
                                                   1 mV/K
   Linearity      Very  good      Very nonlinear  Good  ±1  K    Good  ±0.5  K
                    <±0.1  K
   Accuracy:
   -absolute      High  over wide  High  over  small  Not  possible  Medium
                    range           range
   -differential  Medium          Medium         High            Medium
   Cost  to  make  Medium         Low            Medium          Very  low
   Suitability  for  1C  Not  a standard  Not  a standard  Yes   Yes-very  easily
    integration     process        process


   'The  sensitivity  diminishes  significantly  below  — 100°C.
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