Page 339 - Optical Communications Essentials
P. 339

Test and Measurement



                                                                      Test and Measurement  329


                      vendors offer such light sources that generate a true single-mode laser line for
                      every selected wavelength point. Typically the source is an external-cavity semi-
                      conductor laser. A movable diffraction grating may be used as a tunable filter
                      for wavelength selection. Depending on the source and grating combination, an
                      instrument may be tunable over (for example) the 1280- to 1330-nm, the 1370-
                      to 1495-nm, or the 1460- to 1640-nm band. Wavelength scans, with an output
                      power that is flat across the scanned spectral band, can be done automatically.
                      The minimum output power of such an instrument usually is  10dBm, and the
                      absolute wavelength accuracy is typically  0.01nm ( 10pm).
                        A broadband incoherent light source with a high output power coupled into a
                      single-mode fiber is desirable to evaluate passive DWDM components. Such an
                      instrument can be realized by using the amplified spontaneous emission (ASE)
                      of an erbium-doped fiber amplifier (EDFA). The power spectral density of the
                      output is up to 100 times (20dB) greater than that of edge emitting LEDs and
                      up to 100,000 times (50dB) greater than white-light tungsten lamp sources.
                      The instrument can be specified to have a total output power of greater than
                      3.5mW (5.5dBm) over a 50-nm range with a spectral density of 13dBm/nm
                      ( 50µW/nm). The relatively high-power spectral density allows test person-
                      nel to characterize devices with medium or high insertion loss. Peak wave-
                      lengths might be 1200, 1310, 1430, 1550, or 1650nm.


          19.5. Optical Spectrum Analyzer
                      The widespread implementation of WDM systems calls for making optical spec-
                      trum analyses to characterize the spectral behavior of various telecommunica-
                      tion network elements. One widely used instrument for doing this is an optical
                      spectrum analyzer (OSA), which measures optical power as a function of wave-
                      length. The most common implementation uses a diffraction-grating-based
                      optical filter, which yields wavelength resolutions to less than 0.1nm. Higher
                      wavelength accuracy ( 0.001nm) is achieved with wavelength meters based on
                      Michelson interferometry.
                        Figure 19.5 illustrates the operation of a grating-based optical spectrum ana-
                      lyzer. Light emerging from a fiber is collimated by a lens and is directed onto a
                      diffraction grating that can be rotated. The exit slit selects or filters the spec-
                      trum of the light from the grating. Thus, it determines the spectral resolution
                      of the OSA. The term  resolution bandwidth describes the width of this
                      optical filter. Typical OSAs have selectable filters ranging from 10nm down to
                      0.1nm. The optical filter characteristics determine the dynamic range, which
                      is the ability of the OSA to simultaneously view large and small signals in
                      the same sweep. The bandwidth of the amplifier is a major factor affecting the
                      sensitivity and sweep time of the OSA. The photodiode is usually an InGaAs
                      device.
                        The OSA normally sweeps across a spectral band, making measurements at
                      discretely spaced wavelength points. This spacing depends on the bandwidth
                      resolution capability of the instrument and is known as the trace-point spacing.


                 Downloaded from Digital Engineering Library @ McGraw-Hill (www.digitalengineeringlibrary.com)
                            Copyright © 2004 The McGraw-Hill Companies. All rights reserved.
                              Any use is subject to the Terms of Use as given at the website.
   334   335   336   337   338   339   340   341   342   343   344