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An Intr oduction to Or ganic Photodetectors 221
The rise time and cutoff frequency are closely related as can be
seen from the following analysis. The current i generated by the pho-
todiode is divided into two parts i and i that flow through the inter-
c RL
nal capacitance and the external load resistor, respectively (inset to
Fig. 6.15):
i = i + i (6.26)
C RL
(Here, we are assuming R << R and so we can ignore the negligible
L SH
current that flows through the shunt resistance.) The photodiode and
load resistor are connected in parallel and are consequently subjected
to the same potential difference, allowing us to write
iZ = i R (6.27)
C C RL L
where Z = 1/(2πjfc) is the complex impedance of the capacitance.
C
Hence, we can write
i
c =
2π jfC iR L (6.28)
RL
from which it follows that
i = i 2π jfCR (6.29)
C R L
Substituting into Eq. (6.26), we obtain
i = 1 → i | | = 1 (6.30)
+
RL 12π jfCR RL 1 ( fCR) 2
+ 2π
The 3 dB cutoff frequency f occurs when the signal falls by a factor 2,
C
i.e., when 2πfCR = 1 Æ f = 1/(2πCR). Hence, in the RC-limited regime,
L
the rise time and the cutoff frequency are related by
ln9 . 035
Δt = RCln9 = = (6.31)
r 2π f f
C C
6.4.3 Intrinsic Photodiode Noise Characteristics
Thermal Noise
Above we discussed how photodiodes can be modeled as a current
generator in parallel with a diode, a shunt resistor, and a capacitor. In
the immediate vicinity of V = 0, the slope of the current-voltage curve
is linear, meaning it is possible to drop the diode from the equivalent
circuit representation and use the shunt resistance alone to account