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Measurand Modulation

            230   Chapter Ten


                                  1/Year    1/month
                           Noise Density (Arb.)        1/hour    1Hz        1kHz











                                                     Frequency

                           1.6
                           1.4
                         Signal Voltage  0.8                   In Operation
                           1.2
                            1

                           0.6
                           0.4
                           0.2     Calibration
                            0
                              0   100  200   300  400  500  600   700  800  900 1000
                                          Time from Calibration (Sample No.)
                        Figure 10.16 Logged instrumentation data suggest that the “noise-and-drift” power
                        spectrum is not white, but increases at low frequencies, giving errors far greater
                        than expected from the instrument’s optical noise performance. The time-series was
                        calculated using a 1/f power spectrum, and looks like real data. The greater the
                        period between calibration and operational use, the greater the measurement
                        variance.




                                                                   b
                        Gaussian-distributed complex values with a 1/f power spectrum, here with b =
                        1, and then using the discrete FFT to transform to the time-domain. It looks
                        similar to real measurement drift in an instrument free of ever-increasing
                        fouling, with small variations seen on short time-scales and much larger vari-
                        ations over a longer period. The same approach can be used to investigate other
                        frequency distributions. With b = 0 we have white noise, with b = 2 Brownian
                        noise or a random walk. Of course we generally do not know the details of the
                        noise-and-drift spectrum of our instrument at these very low frequencies. There
                        may for instance be a break frequency above which the noise density is white,
                        as in most semiconductors. There may be spot frequencies corresponding to
                        diurnal variations in calibration. Nevertheless, if 1/f noise is a better descrip-
                        tion of reality than is white noise, it appears that the reduction in drift in going
                        from the 1/year frequencies of annual calibration to 1/ms of the spinning diffuse


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